by Shan, Fei, Lee, Jae-Yun, Tarsoly, Gergely, Zhao, Han-Lin, Wang, Xiao-Lin, Anvar, Tukhtaev, Yoo, Suchang, Kim, Sung-Jin
Published in IEEE transactions on electron devices (01.11.2023)

by Wang, Xiao-Lin, Shan, Fei, Zhao, Han-Lin, Lee, Jae-Yun, Yoo, Suchang, Ryu, Heung Gyoon, Choi, Seungkeun, Anvar, Tukhtaev, Kim, Sung-Jin
Published in Electronic materials letters (01.09.2022)

by You, Soochang, Tukhtaev, Anvar, Tarsoly, Gergely, Zhao, Han Lin, Wang, Xiao Lin, Shan, Fei, Lee, Jae-Yun, Lee, Jin Hee, Jang, Sung Il, Jeong, Yong Jin, Kim, Sung-Jin
Published in Journal of electrical engineering & technology (01.05.2024)

by 이재윤, Jae-yun Lee, Anvar Tukhtaev, 유수창, Suchang Yoo, 김용환, Yong-hwan Kim, 최성곤, Seong-gon Choi, 유흥균, Heung Gyoon Ryu, 정용진, Yong Jin Jeong, 김성진, Sung-jin Kim
Published in 대한금속·재료학회지, 60(8) (05.08.2022)

by Shan, Fei, Lee, Jae-Yun, Tarsoly, Gergely, Zhao, Han-Lin, Wang, Xiao-Lin, Anvar, Tukhtaev, Yoo, Suchang, Kim, Sung-Jin
Published in IEEE transactions on electron devices (01.11.2023)

by Lee, Jae-Yun, Tukhtaev, Anvar, Yoo, Suchang, Kim, Yong-Hwan, Choi, Seong-Gon, Ryu, Heung Gyoon, Jeong, Yong Jin, Kim, Sung-Jin
Published in Korean Journal of Metals and Materials (05.08.2022)