Search Results - "Annaka, Shoichi" :: K.UTB vyhledávací portál

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$An X-ray phase plate using Bragg-Case diffraction$

An X-ray phase plate using Bragg-Case diffraction

by HIRANO, K, IZUMI, K, ISHIKAWA, T, ANNAKA, S, KIKUTA, S
Published in Japanese Journal of Applied Physics (01.03.1991)

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Journal Article

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$Intensity Changes of Fluorescence from a NaI (Tl) Crystal during the Dynamical Diffraction Process$

Intensity Changes of Fluorescence from a NaI (Tl) Crystal during the Dynamical Diffraction Process

by Annaka, Shoichi
Published in Japanese Journal of Applied Physics (01.01.1972)

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Variations in X-ray fluorescence from GaAs and photocurrent in CdS due to standing waves of X-rays

by ANNAKA, S, TAKAHASHI, T, KUKUTA, S
Published in Japanese Journal of Applied Physics (01.01.1984)

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$Rotation of the Electric Vector of the Polarized X-Rays by Diffraction in Crystals$

Rotation of the Electric Vector of the Polarized X-Rays by Diffraction in Crystals

by Annaka, Shoichi, Kohra, Kazutake, Ando, Masami
Published in Japanese Journal of Applied Physics (01.01.1981)

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Journal Article

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Measurement of Physical Constants with An X-Ray Three-Crystal Spectrometer

by Annaka, Shoichi
Published in Japanese Journal of Applied Physics (01.01.1978)

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Journal Article

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Verfahren zur Bor-Diffusion in Halbleiterwafern

by KATAYAMA, MASATAKE, TAKASAKI-SHI, GUNMA-KEN, JP, MOROGA, ISAO, ANNAKA-SHI, GUNMA-KEN, JP, SHINOMIYA, MASARU, ANNAKA-SHI, GUNMA-KEN, JP, FUJIYA, SHOICHI, ANNAKA-SHI, GUNMA-KEN, JP
Year of Publication 20.02.1997

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Patent

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Verfahren zur Herstellung von Polydimethylsiloxanen

by ITOH, KUNIO, TAKASAKI-SHI, GUNMA-KEN, JP, SATOU, YUKINORI, ANNAKA-SHI, GUNMA-KEN, JP, TANAKA, SHOICHI, ANNAKA-SHI, GUNMA-KEN, JP, UMEMURA, KAZUNOBU, ANNAKA-SHI, GUNMA-KEN, JP, SHINOHARA, TOSHIO, TAKASAKI-SHI, GUNMA-KEN, JP, KIZAKI, HIROAKI, ANNAKA-SHI, GUNMA-KEN, JP
Year of Publication 01.10.1998

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Patent

An X-ray phase plate using Bragg-Case diffraction

Intensity Changes of Fluorescence from a NaI (Tl) Crystal during the Dynamical Diffraction Process

Variations in X-ray fluorescence from GaAs and photocurrent in CdS due to standing waves of X-rays

Rotation of the Electric Vector of the Polarized X-Rays by Diffraction in Crystals

Measurement of Physical Constants with An X-Ray Three-Crystal Spectrometer

Verfahren zur Bor-Diffusion in Halbleiterwafern

Verfahren zur Herstellung von Polydimethylsiloxanen

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