Reduction of radiation induced back channel threshold voltage shifts in partially depleted SIMOX CMOS devices by using ADVANTOX(TM ) substrates
Liu, S T, Allen, L P, Anc, M J, Jenkins, W C, Hughes, H L, Twigg, M E, Lawrence, R K
Published in IEEE transactions on nuclear science (01.12.1997)
Published in IEEE transactions on nuclear science (01.12.1997)
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Journal Article
Progress in Non-Cd Quantum Dot Development for Lighting Applications
Anc, M. J., Pickett, N. L., Gresty, N. C., Harris, J. A., Mishra, K. C.
Published in ECS journal of solid state science and technology (01.01.2013)
Published in ECS journal of solid state science and technology (01.01.2013)
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Journal Article
Formation of Si islands in the buried oxide layers of ultra-thin SIMOX structures implanted at 65 keV
Jiao, Jun, Johnson, Benedict, Seraphin, Supapan, Anc, Maria J, Dolan, Robert P, Cordts, Bernhard F
Published in Materials science & engineering. B, Solid-state materials for advanced technology (15.03.2000)
Published in Materials science & engineering. B, Solid-state materials for advanced technology (15.03.2000)
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Journal Article
Conference Proceeding
Thin-layer SIMOX for future applications
Anc, M.J., Dolan, R.P., Jiao, J., Nakai, T.
Published in 1999 IEEE International SOI Conference. Proceedings (Cat. No.99CH36345) (1999)
Published in 1999 IEEE International SOI Conference. Proceedings (Cat. No.99CH36345) (1999)
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Conference Proceeding
Effects of process conditions on the material characteristics of SIMOX with ITOX
Anc, M.J., McMarr, P.J., Mrstik, B.J., Hughes, H.L.
Published in 1996 IEEE International SOI Conference Proceedings (1996)
Published in 1996 IEEE International SOI Conference Proceedings (1996)
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Conference Proceeding
Positive charge trapping in SOI materials
Lawrence, R.K., Mrstik, B.J., Hughes, H.L., McMarr, P.J., Anc, M.J.
Published in 1996 IEEE International SOI Conference Proceedings (1996)
Published in 1996 IEEE International SOI Conference Proceedings (1996)
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Conference Proceeding
Role of buried oxide microstructure in dosimetry of implanted oxygen in SIMOX technology
Anc, M.J., Matthews, B., Dolan, R.P.
Published in 2000 International Conference on Ion Implantation Technology Proceedings. Ion Implantation Technology - 2000 (Cat. No.00EX432) (2000)
Published in 2000 International Conference on Ion Implantation Technology Proceedings. Ion Implantation Technology - 2000 (Cat. No.00EX432) (2000)
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Conference Proceeding
Characterization of low dose SIMOX for low power electronics
Anc, M.J., Allen, L.P., Dolan, R.P., Cordts, B.F., Ryding, G., Mendicino, M.A., Xiaoyu Shi, Maszara, W., Dockerty, R., Vasudev, P.K., Roitman, P.
Published in 1996 IEEE International SOI Conference Proceedings (1996)
Published in 1996 IEEE International SOI Conference Proceedings (1996)
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Conference Proceeding
Improvement in electrical properties of SIMOX by high-temperature oxidation
Mrstik, B.J., McMarr, P.J., Hughes, H.L., Anc, M.J., Krull, W.A.
Published in 1995 IEEE International SOI Conference Proceedings (1995)
Published in 1995 IEEE International SOI Conference Proceedings (1995)
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Conference Proceeding
Crystallographic effects in implantation of oxygen for SIMOX
Anc, M.J., Cordts, B.F., Allen, L.P., Krull, W.A., Guerra, M.A.
Published in Proceedings of 1993 IEEE International SOI Conference (1993)
Published in Proceedings of 1993 IEEE International SOI Conference (1993)
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Conference Proceeding