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tSS-BO: Scalable Bayesian Optimization for Analog Circuit Sizing via Truncated Subspace Sampling

by Gu, Tianchen, Wang, Jiaqi, Bi, Zhaori, Yan, Changhao, Yang, Fan, Qin, Yajie, Cui, Tao, Zeng, Xuan
Published in Proceedings - Design, Automation, and Test in Europe Conference and Exhibition (25.03.2024)

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