A novel diagnostic test generation methodology and its application in production failure isolation
Amyeen, M. Enamul, Dongok Kim, Chandrasekar, Maheshwar, Noman, Mohammad, Venkataraman, Srikanth, Jain, Anurag, Goel, Neha, Sharma, Ramesh
Published in 2016 IEEE International Test Conference (ITC) (01.11.2016)
Published in 2016 IEEE International Test Conference (ITC) (01.11.2016)
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Conference Proceeding
Improving Precision Using Mixed-level Fault Diagnosis
Enamul Amyeen, M., Nayak, D., Venkataraman, S.
Published in 2006 IEEE International Test Conference (01.10.2006)
Published in 2006 IEEE International Test Conference (01.10.2006)
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Conference Proceeding
Defect diagnosis based on DFM guidelines
Dongok Kim, Pomeranz, Irith, Amyeen, M Enamul, Venkataraman, Srikanth
Published in 2010 28th VLSI Test Symposium (VTS) (01.04.2010)
Published in 2010 28th VLSI Test Symposium (VTS) (01.04.2010)
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Conference Proceeding
Prioritizing the Application of DFM Guidelines Based on the Detectability of Systematic Defects
Dongok Kim, Pomeranz, I., Amyeen, M.E., Venkataraman, S.
Published in 2008 17th Asian Test Symposium (01.11.2008)
Published in 2008 17th Asian Test Symposium (01.11.2008)
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Conference Proceeding
Using Scan-Dump Values to Improve Functional-Diagnosis Methodology
Vimjam, V.C., Enamul Amyeen, E., Ruifeng Guo, Venkataraman, S., Hsiao, M., Kai Yang
Published in 25th IEEE VLSI Test Symposium (VTS'07) (01.05.2007)
Published in 25th IEEE VLSI Test Symposium (VTS'07) (01.05.2007)
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Conference Proceeding
A Joint Diagnostic Test Generation Procedure with Dynamic Test Compaction
Amyeen, M. Enamul, Pomeranz, Irith, Venkataraman, Srikanth
Published in 2016 IEEE 25th Asian Test Symposium (ATS) (01.11.2016)
Published in 2016 IEEE 25th Asian Test Symposium (ATS) (01.11.2016)
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Conference Proceeding
Improving the Resolution of Multiple Defect Diagnosis by Removing and Selecting Tests
Wang, Naixing, Pomeranz, Irith, Benware, Brady, Amyeen, M. Enamul, Venkataraman, Srikanth
Published in 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (01.10.2018)
Published in 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (01.10.2018)
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Conference Proceeding
Test reordering for improved scan chain diagnosis using an enhanced defect diagnosis procedure
Venkataraman, Srikanth, Pomeranz, Irith, Bodhe, Shraddha, Amyeen, M. Enamul
Published in 2017 IEEE International Test Conference (ITC) (01.10.2017)
Published in 2017 IEEE International Test Conference (ITC) (01.10.2017)
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Conference Proceeding
Diagnostic resolution improvement through learning-guided physical failure analysis
Yang Xue, Xin Li, Blanton, Ronald D., Lim, Carlston, Amyeen, M. Enamul
Published in 2016 IEEE International Test Conference (ITC) (01.11.2016)
Published in 2016 IEEE International Test Conference (ITC) (01.11.2016)
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Conference Proceeding
Reduction of diagnostic fail data volume and tester time using a dynamic N-cover algorithm
Bodhe, Shraddha, Amyeen, M. Enamul, Galendez, Clariza, Mooers, Houston, Pomeranz, Irith, Venkataraman, Srikanth
Published in 2016 IEEE 34th VLSI Test Symposium (VTS) (01.04.2016)
Published in 2016 IEEE 34th VLSI Test Symposium (VTS) (01.04.2016)
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Conference Proceeding
Journal Article
Implication and evaluation techniques for proving fault equivalence
Enamul Amyeen, M., Fuchs, W.K., Pomeranz, I., Boppana, V.
Published in Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146) (1999)
Published in Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146) (1999)
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Conference Proceeding
Logic BIST silicon debug and volume diagnosis methodology
Amyeen, M. E., Jayalakshmi, A., Venkataraman, S., Pathy, S. V., Tan, E. C.
Published in 2011 IEEE International Test Conference (01.09.2011)
Published in 2011 IEEE International Test Conference (01.09.2011)
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Conference Proceeding
Microprocessor system failures debug and fault isolation methodology
Amyeen, M.E., Venkataraman, S., Mun Wai Mak
Published in 2009 International Test Conference (01.11.2009)
Published in 2009 International Test Conference (01.11.2009)
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Conference Proceeding
Evaluation of the quality of N-detect scan ATPG patterns on a processor
Amyeen, M.E., Venkataraman, S., Ojha, A., Sangbong Lee
Published in 2004 International Conferce on Test (2004)
Published in 2004 International Conferce on Test (2004)
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Conference Proceeding
Testing for systematic defects based on DFM guidelines
Dongok Kim, Amyeen, M.E., Venkataraman, S., Pomeranz, I., Basumallick, S., Landau, B.
Published in 2007 IEEE International Test Conference (01.10.2007)
Published in 2007 IEEE International Test Conference (01.10.2007)
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Conference Proceeding