Investigation and Subcircuit Modeling of Self-Heating in PDSOI NFETs at Cryogenic Temperatures Using Pulsed I - V Technique for Co-Integrated Quantum Technologies
Gupta, Sumreti, Sharma, Deepesh, Amin, Asifa, Srinivasan, Purushothaman, Restrepo, Oscar D., Dixit, Abhisek
Published in IEEE transactions on electron devices (01.09.2024)
Published in IEEE transactions on electron devices (01.09.2024)
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Journal Article
High-Temperature TDDB Investigation on High Performance-Centered Hybrid HZO/HfON/Al 2 O 3 , Ferro-Electric Charge-Trap (FEG) GaN-HEMT
Rathaur, Shivendra K., Wu, Jui-Sheng, Yang, Tsung-Ying, Amin, Asifa, Dixit, Abhisek, Chang, Edward Yi
Published in IEEE transactions on electron devices (01.09.2023)
Published in IEEE transactions on electron devices (01.09.2023)
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Journal Article
High-Temperature TDDB Investigation on High Performance-Centered Hybrid HZO/HfON/Al2O3, Ferro-Electric Charge-Trap (FEG) GaN-HEMT
Rathaur, Shivendra K., Wu, Jui-Sheng, Yang, Tsung-Ying, Amin, Asifa, Dixit, Abhisek, Chang, Edward Yi
Published in IEEE transactions on electron devices (01.09.2023)
Published in IEEE transactions on electron devices (01.09.2023)
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Journal Article
Deep Cryogenic Temperature TDDB in 45-nm PDSOI N-channel FETs for Quantum Computing Applications
Amin, Asifa, Rathi, Aarti, Singh, Sujit K., Dixit, Abhisek, Gonzalez, Oscar H., Srinivasan, P., Guarin, Fernando
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
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Conference Proceeding
Impact of Chuck Temperature on Flicker Noise (1/f) Performance of PDSOI n-channel MOSFETs
Pathak, Shruti, Amin, Asifa, Srinivasan, Purushothaman, Guarin, Fernando, Dixit, Abhisek
Published in 2022 IEEE Latin American Electron Devices Conference (LAEDC) (04.07.2022)
Published in 2022 IEEE Latin American Electron Devices Conference (LAEDC) (04.07.2022)
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Conference Proceeding
Impact of Area-to-Perimeter Ratio Layout Effect on TDDB in 45-nm PDSOI N-channel FETs
Amin, Asifa, Rathi, Aarti, Srinivasan, P., Gonzalez, Oscar H., Dixit, Abhisek
Published in 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) (03.03.2024)
Published in 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) (03.03.2024)
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Conference Proceeding
Time-Dependent Dielectric Breakdown in 45-nm PD-SOI N-Channel FETs at Cryogenic Temperatures for Quantum Computing Applications
Amin, Asifa, Gupta, Sumreti, Srinivasan, Purushothaman, Gonzalez, Oscar H., Guarin, Fernando, Dixit, Abhisek
Published in IEEE transactions on device and materials reliability (01.12.2023)
Published in IEEE transactions on device and materials reliability (01.12.2023)
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Magazine Article