by Penta, Naresh K., Amanapu, H.P., Peethala, B.C., Babu, S.V.
Published in Applied surface science (15.10.2013)

by Penta, Naresh K., Peethala, B.C., Amanapu, H.P., Melman, A., Babu, S.V.
Published in Colloids and surfaces. A, Physicochemical and engineering aspects (20.07.2013)

by Amanapu, H. P., Sagi, K. V., Teugels, L. G., Babu, S. V.
Published in ECS journal of solid state science and technology (01.01.2013)

by Peethala, B. C., Amanapu, H. P., Lagudu, U. R. K., Babu, S. V.
Published in Journal of the Electrochemical Society (01.01.2012)

by Sagi, K. V., Amanapu, H. P., Alety, S. R., Babu, S. V.
Published in ECS journal of solid state science and technology (01.01.2016)

by Turk, M. C., Rock, S. E., Amanapu, H. P., Teugels, L. G., Roy, D.
Published in ECS journal of solid state science and technology (01.01.2013)

by Penta, Naresh K., Amanapu, H. P., Babu, S. V.
Published in ECS journal of solid state science and technology (01.01.2015)

by Veera Dandu, P. R., Peethala, B. C., Amanapu, H. P., Babu, S. V.
Published in Journal of the Electrochemical Society (01.01.2011)

by Penta, Naresh K., Amanapu, H. P., Babu, S. V.
Published in ECS journal of solid state science and technology (2015)

by Sagi, K. V., Amanapu, H. P., Teugels, L. G., Babu, S. V.
Published in ECS journal of solid state science and technology (01.01.2014)

by Amanapu, H. P., Lagudu, U. R. K., John-Kadaksham, A., Babu, S. V., Teki, R.
Published in ECS journal of solid state science and technology (01.01.2013)

by Amanapu, Hari Prasad, Lagudu, Uma Rames, Teki, Ranganath, John-Kadaksham, Arun, Babu, Suryadevara V.
Published in ECS transactions (01.04.2013)

by Xie, R., Montanini, P., Akarvardar, K., Tripathi, N., Haran, B., Johnson, S., Hook, T., Hamieh, B., Corliss, D., Wang, J., Miao, X., Sporre, J., Fronheiser, J., Loubet, N., Sung, M., Sieg, S., Mochizuki, S., Prindle, C., Seo, S., Greene, A., Shearer, J., Labonte, A., Fan, S., Liebmann, L., Chao, R., Arceo, A., Chung, K., Cheon, K., Adusumilli, P., Amanapu, H. P., Bi, Z., Cha, J., Chen, H.-C, Conti, R., Galatage, R., Gluschenkov, O., Kamineni, V., Kim, K., Lee, C., Lie, F., Liu, Z., Mehta, S., Miller, E., Niimi, H., Niu, C., Park, C., Park, D., Raymond, M., Sahu, B., Sankarapandian, M., Siddiqui, S., Southwick, R., Sun, L., Surisetty, C., Tsai, S., Whang, S., Xu, P., Xu, Y., Yeh, C., Zeitzoff, P., Zhang, J., Li, J., Demarest, J., Arnold, J., Canaperi, D., Dunn, D., Felix, N., Gupta, D., Jagannathan, H., Kanakasabapathy, S., Kleemeier, W., Labelle, C., Mottura, M., Oldiges, P., Skordas, S., Standaert, T., Yamashita, T., Colburn, M., Na, M., Paruchuri, V., Lian, S., Divakaruni, R., Gow, T., Lee, S., Knorr, A., Bu, H., Khare, M.
Published in 2016 IEEE International Electron Devices Meeting (IEDM) (01.12.2016)