Resistivity-microstructure correlation of self-annealed electrodeposited copper thin films
Alshwawreh, N., Militzer, M., Bizzotto, D., Kuo, J.C.
Published in Microelectronic engineering (01.07.2012)
Published in Microelectronic engineering (01.07.2012)
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Journal Article
Recrystallization of Electrodeposited Copper Thin Films During Annealing
Alshwawreh, N., Militzer, M., Bizzotto, D.
Published in Journal of electronic materials (01.11.2010)
Published in Journal of electronic materials (01.11.2010)
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Journal Article
Accelerated Recrystallization in Electrodeposited Dual-Layer Copper Thin Films
Alshwawreh, N., Militzer, M., Bizzotto, D., Kuo, J. C.
Published in Journal of the Electrochemical Society (01.01.2013)
Published in Journal of the Electrochemical Society (01.01.2013)
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Journal Article