by Wright, P.S., Rietveld, G., Leferink, F., Van den Brom, H.E., Alonso, F.R.I, Braun, J.P., Ellingsberg, K., Pous, M., Svoboda, M.
Published in 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018) (01.07.2018)