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Published in 2010 Symposium on VLSI Technology (01.06.2010)
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Radiation Effects on CMOS Image Sensors With Sub-2 [Formula Omitted] Pinned Photodiodes
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Published in IEEE transactions on nuclear science (01.08.2012)
Published in IEEE transactions on nuclear science (01.08.2012)
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Journal Article
Radiation Effects on CMOS Image Sensors With Sub-2 mu rm m Pinned Photodiodes
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Published in IEEE transactions on nuclear science (01.08.2012)
Published in IEEE transactions on nuclear science (01.08.2012)
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Published in IEEE transactions on nuclear science (01.12.2012)
Published in IEEE transactions on nuclear science (01.12.2012)
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Published in 2021 IEEE International Electron Devices Meeting (IEDM) (11.12.2021)
Published in 2021 IEEE International Electron Devices Meeting (IEDM) (11.12.2021)
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Conference Proceeding
ETSOI CMOS for system-on-chip applications featuring 22nm gate length, sub-100nm gate pitch, and 0.08µm2 SRAM cell
Cheng, K., Khakifirooz, A., Kulkarni, P., Ponoth, S., Haran, B., Kumar, A., Adam, T., Reznicek, A., Loubet, N., He, H., Kuss, J., Wang, M., Levin, T. M., Monsieur, F., Liu, Q., Sreenivasan, R., Cai, J., Kimball, A., Mehta, S., Luning, S., Zhu, Y., Zhu, Z., Yamamoto, T., Bryant, A., Lin, C., Naczas, S., Jagannathan, H., Edge, L. F., Allegret-Maret, S., Dube, A., Kanakasabapathy, S., Schmitz, S., Inada, A., Seo, S., Raymond, M., Zhang, Z., Yagishita, A., Demarest, J., Li, J., Hopstaken, M., Berliner, N., Upham, A., Johnson, R., Holmes, S., Standaert, T., Smalley, M., Zamdmer, N., Ren, Z., Wu, T., Bu, H., Paruchuri, V., Sadana, D., Narayanan, V., Haensch, W., O'Neill, J., Hook, T., Khare, M., Doris, B.
Published in 2011 Symposium on VLSI Technology - Digest of Technical Papers (01.06.2011)
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Published in 2011 Symposium on VLSI Technology - Digest of Technical Papers (01.06.2011)
Conference Proceeding
ETSOI CMOS for system-on-chip applications featuring 22nm gate length, sub-100nm gate pitch, and 0.08µm2 SRAM cell
Cheng, K., Khakifirooz, A., Kulkarni, P., Ponoth, S., Haran, B., Kumar, A., Adam, T., Reznicek, A., Loubet, N., He, H., Kuss, J., Wang, M., Levin, T. M., Monsieur, F., Liu, Q., Sreenivasan, R., Cai, J., Kimball, A., Mehta, S., Luning, S., Zhu, Y., Zhu, Z., Yamamoto, T., Bryant, A., Lin, C., Naczas, S., Jagannathan, H., Edge, L. F., Allegret-Maret, S., Dube, A., Kanakasabapathy, S., Schmitz, S., Inada, A., Seo, S., Raymond, M., Zhang, Z., Yagishita, A., Demarest, J., Li, J., Hopstaken, M., Berliner, N., Upham, A., Johnson, R., Holmes, S., Standaert, T., Smalley, M., Zamdmer, N., Ren, Z., Wu, T., Bu, H., Paruchuri, V., Sadana, D., Narayanan, V., Haensch, W., O'Neill, J., Hook, T., Khare, M., Doris, B.
Published in 2011 Symposium on VLSI Circuits - Digest of Technical Papers (01.06.2011)
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Published in 2011 Symposium on VLSI Circuits - Digest of Technical Papers (01.06.2011)
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Color image sensor and method of manufacturing the same
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Year of Publication 17.08.2016
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Year of Publication 17.08.2016
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Year of Publication 06.07.2016
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Back-illuminated integrated imaging device with simplified interconnect routing
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Year of Publication 13.04.2016
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Integrated imaging device of back illumination of interconnection wiring with simplify
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Year of Publication 06.04.2016
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Year of Publication 01.10.2014
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QING LIU, HEMANTH JAGANNATHAN, LISA EDGE, NICOLAS LOUBET, STEPHANE ALLEGRET-MARET, BRUCE DORIS, PRASANNA KHARE, KANGGUO CHENG
Year of Publication 30.07.2014
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Year of Publication 30.07.2014
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