First principles investigation of charge transition levels in monoclinic, orthorhombic, tetragonal, and cubic crystallographic phases of HfO2
Alam, Md Nur K, Clima, S., O'Sullivan, B. J., Kaczer, B., Pourtois, G., Heyns, M., Van Houdt, J.
Published in Journal of applied physics (28.02.2021)
Published in Journal of applied physics (28.02.2021)
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Journal Article
Compact Modeling of Multidomain Ferroelectric FETs: Charge Trapping, Channel Percolation, and Nucleation-Growth Domain Dynamics
Xiang, Y., Bardon, M. Garcia, Kaczer, B., Alam, Md Nur K., Ragnarsson, L.-A., Kaczmarek, K., Parvais, B., Groeseneken, G., Van Houdt, J.
Published in IEEE transactions on electron devices (01.04.2021)
Published in IEEE transactions on electron devices (01.04.2021)
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Journal Article
On the Modeling of Polycrystalline Ferroelectric Thin Films: Landau-Based Models Versus Monte Carlo-Based Models Versus Experiment
Thesberg, Mischa, Alam, Md Nur K., Truijen, Brecht, Kaczer, Ben, Roussel, Philippe J., Stanojevic, Zlatan, Baumgartner, Oskar, Schanovsky, Franz, Karner, Markus, Kosina, Hans
Published in IEEE transactions on electron devices (01.06.2022)
Published in IEEE transactions on electron devices (01.06.2022)
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Journal Article
Impact of Charge Trapping and Depolarization on Data Retention Using Simultaneous P-V and I-V in HfO₂-Based Ferroelectric FET
Higashi, Y., Ronchi, N., Kaczer, B., Alam, Md Nur K., O'Sullivan, B. J., Banerjee, K., McMitchell, S. R. C., Breuil, L., Walke, A., Van den Bosch, G., Linten, D., Van Houdt, J.
Published in IEEE transactions on electron devices (01.09.2021)
Published in IEEE transactions on electron devices (01.09.2021)
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Journal Article
High performance La-doped HZO based ferroelectric capacitors by interfacial engineering
Popovici, M.I., Bizindavyi, J., Favia, P., Clima, S., Alam, Md. Nur K., Ramachandran, R.K., Walke, A.M., Celano, U., Leonhardt, A., Mukherjee, S., Richard, O., Illiberi, A., Givens, M., Delhougne, R., Van Houdt, J., Kar, G. Sankar
Published in 2022 International Electron Devices Meeting (IEDM) (03.12.2022)
Published in 2022 International Electron Devices Meeting (IEDM) (03.12.2022)
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Conference Proceeding
Trap-polarization interaction during low-field trap characterization on hafnia-based ferroelectric gatestacks
Truijen, B., O'Sullivan, B., Alam, Md Nur K., Claes, D., Thesberg, M., Roussel, P., Chasin, A., Van den Bosch, G., Kaczer, B., Van Houdt, J.
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
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Conference Proceeding
Physical Insights on Steep Slope FEFETs including Nucleation-Propagation and Charge Trapping
Xiang, Y., Verhulst, A. S., Parvais, B., Horiguchi, N., Groeseneken, G., Houdt, J. Van, Bardon, M. Garcia, Alam, Md Nur K., Thesberg, M., Kaczer, B., Roussel, P., Popovici, M. I., Ragnarsson, L.-A., Truijen, B.
Published in 2019 IEEE International Electron Devices Meeting (IEDM) (01.12.2019)
Published in 2019 IEEE International Electron Devices Meeting (IEDM) (01.12.2019)
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Conference Proceeding
Insight to Data Retention loss in ferroelectric Hf0.5Zr0.5O2 pFET and nFET from simultaneous PV and IV measurements
Alam, Md Nur K., Higashi, Yusuke, Truijen, B., Kaczer, B., Popovici, Mihaela Ioana, O'Sullivan, Bj, Roussel, Ph, Degraeve, Robin, Heyns, M., Van Houdt, J.
Published in 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (12.06.2022)
Published in 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (12.06.2022)
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Conference Proceeding
Transition-state-theory-based interpretation of Landau double well potential for ferroelectrics
Alam, Md Nur K, Clima, S, Kaczer, B, Roussel, Ph, Truijen, B, Ragnarsson, L. - A, Horiguchi, N, Heyns, M, Van Houdt, J
Year of Publication 19.04.2024
Year of Publication 19.04.2024
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Journal Article
Investigation of ferroelectric HfZrO FET for steep slope applications
Alam, Md Nur K., Kaczer, B., Ragnarsson, L. -A., Popovici, M. I., Horiguchi, N., Heyns, M., Van Houdt, J.
Published in 2018 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) (01.10.2018)
Published in 2018 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) (01.10.2018)
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Conference Proceeding
HfZrO Ferroelectric Characterization and Parameterization of Response to Arbitrary Excitation Waveform
Alam, Md Nur K., Thesberg, M., Kaczer, B., Roussel, Ph, Vermeulen, B., Truijen, B., Popovici, M. I., Ragnarsson, L.-A., Verhulst, A. S., Horiguchi, N., Heyns, M., Van Houdt, J.
Published in 2019 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) (14.10.2019)
Published in 2019 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) (14.10.2019)
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Conference Proceeding