Effect of H2 content on reliability of ultrathin in-situ steam generated (ISSG) SiO2
Luo, T.Y., Laughery, M., Brown, G.A., Al-Shareef, H.N., Watt, V.H.C., Karamcheti, A., Jackson, M.D., Huff, H.R.
Published in IEEE electron device letters (01.09.2000)
Published in IEEE electron device letters (01.09.2000)
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Journal Article
Analysis of the oxidation kinetics and barrier layer properties of ZrN and Pt/Ru thin films for DRAM applications
Al-Shareef, H.N., Chen, X., Lichtenwalner, D.J., Kingon, A.I.
Published in Thin solid films (01.07.1996)
Published in Thin solid films (01.07.1996)
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Journal Article
Leakage and Reliability Characteristics of Lead Zirconate Titanate Thin-Film Capacitors
Al-Shareef, Husam N., Dimos, Duane
Published in Journal of the American Ceramic Society (01.12.1997)
Published in Journal of the American Ceramic Society (01.12.1997)
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Journal Article
Phase evolution and annealing effects on the electrical properties of Pb(Zr0.53Ti0.47)O3 thin films with RuO2 electrodes
AL-SHAREEF, H. N, BELLUR, K. R, AUCIELLO, O, KINGON, A. I
Published in Thin solid films (01.02.1995)
Published in Thin solid films (01.02.1995)
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Journal Article
Effect of H 2 content on reliability of ultrathin in-situ steam generated (ISSG) SiO 2
Luo, T.Y., Laughery, M., Brown, G.A., Al-Shareef, H.N., Watt, V.H.C., Karamcheti, A., Jackson, M.D., Huff, H.R.
Published in IEEE electron device letters (01.09.2000)
Published in IEEE electron device letters (01.09.2000)
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Journal Article
Plasma nitridation of very thin gate dielectrics
Al-Shareef, H.N, Bersuker, G, Lim, C, Murto, R, Borthakur, S, Brown, G.A, Huff, H.R
Published in Microelectronic engineering (01.11.2001)
Published in Microelectronic engineering (01.11.2001)
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Journal Article
Conference Proceeding
La0.5Sr0.5CoO3 electrode technology for Pb(Zr,Ti)O3 thin film nonvolatile memories
Tuttle, B.A., Al-Shareef, H.N., Warren, W.L., Raymond, M.V., Headley, T.J., Voigt, J.A., Evans, J., Ramesh, R.
Published in Microelectronic engineering (01.12.1995)
Published in Microelectronic engineering (01.12.1995)
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Journal Article
Ultra-Thin High Quality Oxynitride Formed by NH3 Nitridation and High Pressure O2 Re-oxidation
Luo, T.Y., Watt, V.H.C., Al-Shareef, H.N., Brown, G.A., Karamcheti, A., Jackson, M.D., Huff, H.R., Evans, B., Kwong, D.L.
Published in 30th European Solid-State Device Research Conference (2000)
Published in 30th European Solid-State Device Research Conference (2000)
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Conference Proceeding
Electrical characterization of sol-gel derived PZT thin films
Bellur, K.R., Al-Shareef, H.N., Rou, S.H., Gifford, K.D., Auciello, O., Kingon, A.I.
Published in ISAF '92: Proceedings of the Eighth IEEE International Symposium on Applications of Ferroelectrics (1992)
Published in ISAF '92: Proceedings of the Eighth IEEE International Symposium on Applications of Ferroelectrics (1992)
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Conference Proceeding