Opens and Delay Faults in CMOS RAM Address Decoders
Hamdioui, S., Al-Ars, Z., van de Goor, A.J.
Published in IEEE transactions on computers (01.12.2006)
Published in IEEE transactions on computers (01.12.2006)
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Journal Article
Test Set Development for Cache Memory in Modern Microprocessors
Al-Ars, Z., Hamdioui, S., Gaydadjiev, G., Vassiliadis, S.
Published in IEEE transactions on very large scale integration (VLSI) systems (01.06.2008)
Published in IEEE transactions on very large scale integration (VLSI) systems (01.06.2008)
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Journal Article
Testing static and dynamic faults in random access memories
Hamdioui, S., Al-Ars, Z., van de Goor, Ad.J.
Published in Proceedings 20th IEEE VLSI Test Symposium (VTS 2002) (2002)
Published in Proceedings 20th IEEE VLSI Test Symposium (VTS 2002) (2002)
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Conference Proceeding
Approximating infinite dynamic behavior for DRAM cell defects
Al-Ars, Z., van de Goor, Ad.J.
Published in Proceedings 20th IEEE VLSI Test Symposium (VTS 2002) (2002)
Published in Proceedings 20th IEEE VLSI Test Symposium (VTS 2002) (2002)
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Conference Proceeding
Soft faults and the importance of stresses in memory testing
Al-Ars, Z., van de Goor, A.J.
Published in Proceedings Design, Automation and Test in Europe Conference and Exhibition (2004)
Published in Proceedings Design, Automation and Test in Europe Conference and Exhibition (2004)
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Conference Proceeding
Effects of bit line coupling on the faulty behavior of DRAMs
Al-Ars, Z., Hamdioui, S., van de Goor, Ad.J.
Published in 22nd IEEE VLSI Test Symposium, 2004. Proceedings (2004)
Published in 22nd IEEE VLSI Test Symposium, 2004. Proceedings (2004)
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Conference Proceeding
Framework for Fault Analysis and Test Generation in DRAMs
Al-Ars, Zaid, Hamdioui, Said, Mueller, Georg, Goor, Ad J. van de
Published in Design, Automation and Test in Europe (07.03.2005)
Published in Design, Automation and Test in Europe (07.03.2005)
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Conference Proceeding