Analytics-statistics mixed training and its fitness to semisupervised manufacturing
Parashar, Parag, Chen, Chun Han, Akbar, Chandni, Fu, Sze Ming, Rawat, Tejender S, Pratik, Sparsh, Butola, Rajat, Chen, Shih Han, Lin, Albert S
Published in PloS one (13.08.2019)
Published in PloS one (13.08.2019)
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Journal Article
Physics-prior Bayesian neural networks in semiconductor processing
Chen, Chun Han, Parashar, Parag, Akbar, Chandni, Fu, Sze Ming, Syu, Ming-Ying, Lin, Albert
Published in IEEE access (01.01.2019)
Published in IEEE access (01.01.2019)
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Journal Article
Intelligent Photolithography Corrections Using Dimensionality Reductions
Parashar, Parag, Akbar, Chandni, Rawat, Tejender S., Pratik, Sparsh, Butola, Rajat, Chen, Shih H., Chang, Yung-Sung, Nuannimnoi, Sirapop, Lin, Albert S.
Published in IEEE photonics journal (01.10.2019)
Published in IEEE photonics journal (01.10.2019)
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Journal Article
Intelligent Manufacturing: TCAD-Assisted Adaptive Weighting Neural Networks
Huang, Chien Y., Fu, Sze M., Parashar, Parag, Chen, Chun H., Akbar, Chandni, Lin, Albert S.
Published in IEEE access (2018)
Published in IEEE access (2018)
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Journal Article
Machine Learning Approach to Predicting Tunnel Field-Effect Transistors
Akbar, Chandni, Thoti, Narasimhulu, Li, Yiming
Published in 2021 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) (19.04.2021)
Published in 2021 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) (19.04.2021)
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Conference Proceeding
Application of long short-term memory modeling technique to predict process variation effects of stacked gate-all-around Si nanosheet complementary-field effect transistors
Butola, Rajat, Li, Yiming, Kola, Sekhar Reddy, Akbar, Chandni, Chuang, Min-Hui
Published in Computers & electrical engineering (01.01.2023)
Published in Computers & electrical engineering (01.01.2023)
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Journal Article
Intelligent Modeling of Electrical Characteristics of Multi-Channel Gate All Around Silicon Nanosheet MOSFETs Induced by Work Function Fluctuation
Akbar, Chandni, Li, Yiming, Sung, Wen-Li
Published in 2022 IEEE 22nd International Conference on Nanotechnology (NANO) (04.07.2022)
Published in 2022 IEEE 22nd International Conference on Nanotechnology (NANO) (04.07.2022)
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Conference Proceeding
Estimating the Process Variation Effects of Stacked Gate All Around Si Nanosheet CFETs Using Artificial Neural Network Modeling Framework
Butola, Rajat, Li, Yiming, Kola, Sekhar Reddy, Chuang, Min-Hui, Akbar, Chandni
Published in 2022 IEEE 22nd International Conference on Nanotechnology (NANO) (04.07.2022)
Published in 2022 IEEE 22nd International Conference on Nanotechnology (NANO) (04.07.2022)
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Conference Proceeding