Review of Some Critical Aspects of Ge and GeOI Substrates
Clavelier, Laurent, Le Royer, Cyrille, Morand, Yves, Deguet, Chrystel, Vincent, B., Damlencourt, Jean-François, Hartmann, Jean-Michel, Kermarrec, O., Signamarcheix, T., Depuydt, B., Theuwis, Antoon, Quaeyhaegens, C., Cherkashin, N., Rivallin, P., Tabone, Claude, Lagrasta, S., Campidelli, Y., Descombes, S., Sanchez, L., Akastu, T., Rigny, A., Bensahel, D., Billon, Thierry, Kernevez, Nelly, Deleonibus, Simon
Published in ECS transactions (20.10.2006)
Published in ECS transactions (20.10.2006)
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