Search Results - "Ahn, MyoungKi" :: K.UTB vyhledávací portál

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Polarization-sensitive spectral-domain optical coherence tomography using a multi-line single camera spectrometer

by Song, Cheol, Ahn, MyoungKi, Gweon, DaeGab
Published in Optics express (08.11.2010)

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Journal Article

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Novel approach to optical profiler with gradient focal point methods

by Leeghim, Henzeh, Ahn, MyoungKi, Kim, Kwangsoo
Published in Optics express (08.10.2012)

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Journal Article

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Spectral imaging optics

by PARK GWANGSIK, AHN MYOUNGKI, KIM WOOKRAE, JUNG JAEHWANG
Year of Publication 31.03.2021

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Patent

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Design and analysis of a cross-type structured-illumination confocal microscope for high speed and high resolution

by Kim, Young-Duk, Ahn, MyoungKi, Kim, Taejoong, Yoo, Hongki, Gweon, DaeGab
Published in Measurement science & technology (01.10.2012)

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Journal Article

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High-resolution high-speed spectral domain optical coherence tomography

by Cheol Song, MyoungKi Ahn, DaeGab Gweon, HyungSuck Cho
Published in 2009 International Symposium on Optomechatronic Technologies (01.09.2009)

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Conference Proceeding

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Cross structured illumination for high speed high resolution line scanning confocal microscopy

by Ahn, MyoungKi, Kim, Taejoong, Kim, YoungDuk, Gweon, DaeGab, Lee, Jun-Hee
Published in Measurement science & technology (01.01.2011)

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Journal Article

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Imaging ellipsometry (IE)-based inspection method and method of fabricating semiconductor device by using IE-based inspection method

by Kim, Wookrae, Ahn, Myoungki, Lee, Myungjun, Jung, Jaehwang
Year of Publication 30.04.2024

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Patent

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Development of in vivo Confocal Microscope Combined with Reflection and Fluorescence Imaging Modes

by Ahn, MyoungKi, Kim, YoungDuk, Song, Cheol, Gweon, DaeGab
Published in International journal of optomechatronics (08.11.2010)

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Journal Article

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Measurement system capable of adjusting AOI, AOI spread and azimuth of incident light

by Kim, Wookrae, Ahn, Myoungki, Yoon, Changhyeong, Jung, Jaehwang
Year of Publication 11.04.2023

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Patent

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MEASUREMENT SYSTEM CAPABLE OF ADJUSTING AOI, AOI SPREAD AND AZIMUTH OF INCIDENT LIGHT

by AHN, Myoungki, KIM, Wookrae, YOON, Changhyeong, JUNG, Jaehwang
Year of Publication 25.11.2021

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Patent

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IMAGING ELLIPSOMETRY (IE)-BASED INSPECTION METHOD AND METHOD OF FABRICATING SEMICONDUCTOR DEVICE BY USING IE-BASED INSPECTION METHOD

by Kim, Wookrae, Ahn, Myoungki, Lee, Myungjun, Jung, Jaehwang
Year of Publication 28.01.2021

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Patent

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Line scanning confocal microscopy with the use of cross structured illumination

by MyoungKi Ahn, Taejoong Kim, YoungDuk Kim, DaeGab Gweon
Published in 2010 International Symposium on Optomechatronic Technologies (01.10.2010)

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Conference Proceeding

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