Accurate Recycled FPGA Detection Using an Exhaustive-Fingerprinting Technique Assisted by WID Process Variation Modeling
Ahmed, Foisal, Shintani, Michihiro, Inoue, Michiko
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.08.2021)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.08.2021)
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Journal Article
Cross-layer Bayesian Network for UAV Health Monitoring
Ahmed, Foisal, Jenihhin, Maksim
Published in 2024 2nd International Conference on Unmanned Vehicle Systems-Oman (UVS) (12.02.2024)
Published in 2024 2nd International Conference on Unmanned Vehicle Systems-Oman (UVS) (12.02.2024)
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Conference Proceeding
Holistic IJTAG-based External and Internal Fault Monitoring in UAVs
Ahmed, Foisal, Jenihhin, Maksim
Published in 2023 IEEE 24th Latin American Test Symposium (LATS) (21.03.2023)
Published in 2023 IEEE 24th Latin American Test Symposium (LATS) (21.03.2023)
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Conference Proceeding
Systematic Unsupervised Recycled Field-Programmable Gate Array Detection
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Paper
Journal Article
Unsupervised Recycled FPGA Detection Using Symmetry Analysis
Tarique, Tanvir Ahmad, Ahmed, Foisal, Jenihhin, Maksim, Ali, Liakot
Published in 2022 12th International Conference on Electrical and Computer Engineering (ICECE) (21.12.2022)
Published in 2022 12th International Conference on Electrical and Computer Engineering (ICECE) (21.12.2022)
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Conference Proceeding
Automated Car Parking Using Advanced Image Recognition and License Validation
Adnan, Ahmed, Foisal, Bhuiyan, Md Sadman Shakif, Talha, Md Abu, Ahmad, Shameem, Islam, Md Mazharul, Mannan, Lamia, Rahman, Md Abdur
Published in 2023 26th International Conference on Computer and Information Technology (ICCIT) (13.12.2023)
Published in 2023 26th International Conference on Computer and Information Technology (ICCIT) (13.12.2023)
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Conference Proceeding
Low Cost Recycled FPGA Detection Using Virtual Probe Technique
Ahmed, Foisal, Shintani, Michihiro, Inoue, Michiko
Published in 2019 IEEE International Test Conference in Asia (ITC-Asia) (01.09.2019)
Published in 2019 IEEE International Test Conference in Asia (ITC-Asia) (01.09.2019)
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Conference Proceeding
Feature Engineering for Recycled FPGA Detection Based on WID Variation Modeling
Ahmed, Foisal, Shintani, Michihiro, Inoue, Michiko
Published in 2019 IEEE European Test Symposium (ETS) (01.05.2019)
Published in 2019 IEEE European Test Symposium (ETS) (01.05.2019)
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Conference Proceeding
Reliability-Critical Computation Offloading in UAV Swarms
Rahbari, Dadmehr, Ahmed, Foisal, Jenihhin, Maksim, Alam, Muhammad Mahtab, Le Moullec, Yannick
Published in IEEE systems journal (31.07.2024)
Published in IEEE systems journal (31.07.2024)
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Journal Article
Study on High-Accuracy and Low-Cost Recycled FPGA Detection
Ahmed, Foisal, Shintani, Michihiro, Inoue, Michiko
Published in 2021 IEEE International Test Conference (ITC) (01.10.2021)
Published in 2021 IEEE International Test Conference (ITC) (01.10.2021)
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Conference Proceeding
Systematic Unsupervised Recycled Field-Programmable Gate Array Detection
Isaka, Yuya, Shintani, Michihiro, Ahmed, Foisal, Inoue, Michiko
Published in IEEE transactions on device and materials reliability (01.06.2022)
Published in IEEE transactions on device and materials reliability (01.06.2022)
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Magazine Article
On BTI Aging Rejuvenation in Memory Address Decoders
Gursoy, Cemil Cem, Kraak, Daniel, Ahmed, Foisal, Taouil, Mottaqiallah, Jenihhin, Maksim, Hamdioui, Said
Year of Publication 19.12.2022
Year of Publication 19.12.2022
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Journal Article