by Momeni Pakdehi, D, Aprojanz, J, Sinterhauf, A, Pierz, K, Kruskopf, M, Willke, P, Baringhaus, J, Stöckmann, J. P, Traeger, G. A, Hohls, F, Tegenkamp, C, Wenderoth, M, Ahlers, F. J, Schumacher, H. W
Published in ACS applied materials & interfaces (14.02.2018)

by Drung, D, Krause, C, Becker, U, Scherer, H, Ahlers, F J
Published in Review of scientific instruments (01.02.2015)

by Könemann, J, Leicht, C, Ahlers, F-J, Pesel, E, Pierz,, K, Schumacher, H W
Published in Journal of physics. Conference series (28.12.2011)

by Scherer, H, Schurr, J, Ahlers, F J
Published in Metrologia (01.06.2017)

by Schurr, J, Ahlers, F-J, Hein, G, Melcher, J, Pierz, K, Overney, F, Wood, B M
Published in Metrologia (01.02.2006)

by Hapke-Wurst, I, Zeitler, U, Schumacher, H W, Haug, R J, Pierz, K, Ahlers, F J
Published in Semiconductor science and technology (01.11.1999)

by Momeni Pakdehi, D, Pierz, K, Wundrack, S, Aprojanz, J, Nguyen, T. T. N, Dziomba, T, Hohls, F, Bakin, A, Stosch, R, Tegenkamp, C, Ahlers, F. J, Schumacher, H. W
Published in ACS applied nano materials (22.02.2019)

by Ebbecke, J., Fletcher, N.E., Ahlers, F.-J., Hartland, A., Janssen, T.J.B.M.
Published in IEEE transactions on instrumentation and measurement (01.04.2003)

by TARANENKO, V. B, AHLERS, F. J, PIERZ, K
Published in Applied physics. B, Lasers and optics (01.07.2002)

by Gottwaldt, L, Pierz, K, Ahlers, F J, Schweitzer, L, Göbel, E O
Published in Journal of physics. Condensed matter (30.07.2003)

by Schurr, J., Melcher, J., Pierz, K., Hein, G., Ahlers, F.-J.
Published in IEEE transactions on instrumentation and measurement (01.06.2004)

by Gottwaldt, L., Pierz, K., Ahlers, F.J., Göbel, E.O., Nau, S., Torunski, T., Stolz, W.
Published in Journal of crystal growth (01.04.2003)

by Ahlers, F J, Jeanneret, B, Overney, F, Schurr, J, Wood, B M
Published in Metrologia (01.10.2009)

by Stognei, O V, Kalinin, Yu E, Zolotukhin, I V, Sitnikov, A V, Wagner, V, Ahlers, F J
Published in Journal of physics. Condensed matter (25.06.2003)

by Schurr, J., Melcher, J., von Campenhausen, A., Pierz, K., Hein, G., Ahlers, F.-J.
Published in IEEE transactions on instrumentation and measurement (01.04.2001)

by Schurr, J, Melcher, J, Campenhausen, A von, Hein, G, Ahlers, F-J, Pierz, K
Published in Metrologia (01.02.2002)

by Kalmbach, C.-C, Schurr, J., Müller, A., Kruskopf, M., Pierz, K., Ahlers, F. J.
Published in 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016) (01.07.2016)

by Schurr, J, Ahlers, F J, Hein, G, Pierz, K
Published in Metrologia (01.02.2007)

by Schneider, D, Klaffs, T, Pierz, K, Ahlers, F.-J
Published in Physica. B, Condensed matter (01.04.2001)

by Ahlers, F J, Hein, G, Scherer, H, Bilek, L, Nickel, H, Losch, R, Schlapp, W
Published in Semiconductor science and technology (01.12.1993)