Applying Complementary Trap Characterization Technique to Crystalline γ-Phase-Al2O3 for Improved Understanding of Nonvolatile Memory Operation and Reliability
ZAHID, Mohammed B, RUIZ AGUADO, Daniel, DEGRAEVE, R, WANG, W. C, GOVOREANU, Bogdan, TOLEDANO-LUQUE, Maria, AFANAS'EV, V. V, VAN HOUDT, Jan
Published in IEEE transactions on electron devices (01.11.2010)
Published in IEEE transactions on electron devices (01.11.2010)
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Journal Article
Energy and Spatial Distributions of Electron Traps Throughout SiO2/Al2O3 Stacks as the IPD in Flash Memory Application
XUE FENG ZHENG, WEI DONG ZHANG, GOVOREANU, Bogdan, RUIZ AGUADO, Daniel, JIAN FU ZHANG, VAN HOUDT, Jan
Published in IEEE transactions on electron devices (2010)
Published in IEEE transactions on electron devices (2010)
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Journal Article
Energy and Spatial Distributions of Electron Traps Throughout \hbox/\hbox\hbox Stacks as the IPD in Flash Memory Application
Xue Feng Zheng, Wei Dong Zhang, Govoreanu, B., Aguado, D.R., Jian Fu Zhang, Van Houdt, J.
Published in IEEE transactions on electron devices (01.01.2010)
Published in IEEE transactions on electron devices (01.01.2010)
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Journal Article
Applying Complementary Trap Characterization Technique to Crystalline [Formula Omitted]-Phase-[Formula Omitted] for Improved Understanding of Nonvolatile Memory Operation and Reliability
Zahid, Mohammed B, Aguado, Daniel Ruiz, Degraeve, R, Wang, W. C, Govoreanu, Bogdan, Toledano-Luque, María, Afanasev, V. V, Van Houdt, Jan
Published in IEEE transactions on electron devices (01.11.2010)
Published in IEEE transactions on electron devices (01.11.2010)
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Journal Article
Applying Complementary Trap Characterization Technique to Crystalline g -Phase- hbox Al 2 hbox O 3 for Improved Understanding of Nonvolatile Memory Operation and Reliability
Zahid, Mohammed B, Aguado, Daniel Ruiz, Degraeve, R, Wang, W C, Govoreanu, Bogdan, Toledano-Luque, Maria, Afanasev, V V, Van Houdt, Jan
Published in IEEE transactions on electron devices (01.11.2010)
Published in IEEE transactions on electron devices (01.11.2010)
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Journal Article
Applying Complementary Trap Characterization Technique to Crystalline \gamma-Phase- \hbox \hbox for Improved Understanding of Nonvolatile Memory Operation and Reliability
Zahid, Mohammed B, Aguado, Daniel Ruiz, Degraeve, R, Wang, W C, Govoreanu, Bogdan, Toledano-Luque, María, Afanasev, V V, Van Houdt, Jan
Published in IEEE transactions on electron devices (01.11.2010)
Published in IEEE transactions on electron devices (01.11.2010)
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Journal Article
The Flash Memory Cell for the Nodes to Come: Material Requirements from a Device Perspective
Govoreanu, Bogdan, Kittl, Jorge A., De Vos, Joeri, Rothschild, Aude, Blomme, Pieter, Wellekens, Dirk, Ruiz Aguado, Daniel, Jurczak, Malgorzata, Van Houdt, Jan
Published in ECS transactions (15.05.2009)
Published in ECS transactions (15.05.2009)
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