Test Frequency Compaction for Fault Detection in Analog Circuits Using Sensitivity Analysis
Adha, Ajaykumar, Nourani, Mehrdad
Published in 2018 IEEE 13th Dallas Circuits and Systems Conference (DCAS) (01.11.2018)
Published in 2018 IEEE 13th Dallas Circuits and Systems Conference (DCAS) (01.11.2018)
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