Gate-Length and Drain-Bias Dependence of Band-to-Band Tunneling-Induced Drain Leakage in Irradiated Fully Depleted SOI Devices
Mamouni, F.E., Dixit, S.K., Schrimpf, R.D., Adell, P.C., Esqueda, I.S., McLain, M.L., Barnaby, H.J., Cristoloveanu, S., Xiong, W.
Published in IEEE transactions on nuclear science (01.12.2008)
Published in IEEE transactions on nuclear science (01.12.2008)
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Journal Article
Modeling the Radiation Response of Fully-Depleted SOI n-Channel MOSFETs
Esqueda, I.S., Barnaby, H.J., McLain, M.L., Adell, P.C., Mamouni, F.E., Dixit, S.K., Schrimpf, R.D., Xiong, W.
Published in IEEE transactions on nuclear science (01.08.2009)
Published in IEEE transactions on nuclear science (01.08.2009)
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Journal Article
The Effects of Hydrogen in Hermetically Sealed Packages on the Total Dose and Dose Rate Response of Bipolar Linear Circuits
Pease, R.L., Platteter, D.G., Dunham, G.W., Seiler, J.E., Adell, P.C., Barnaby, H.J., Jie Chen
Published in IEEE transactions on nuclear science (01.12.2007)
Published in IEEE transactions on nuclear science (01.12.2007)
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Journal Article
Total Dose and Single Event Transients in Linear Voltage Regulators
Kelly, A.T., Adell, P.C., Witulski, A.F., Holman, W.T., Schrimpf, R.D., Pouget, V.
Published in IEEE transactions on nuclear science (01.08.2007)
Published in IEEE transactions on nuclear science (01.08.2007)
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Journal Article
Impact of VCO Topology on SET Induced Frequency Response
Wenjian Chen, Varanasi, N., Pouget, V., Barnaby, H.J., Vermeire, B., Adell, P.C., Copani, T., Fouillat, P.
Published in IEEE transactions on nuclear science (01.12.2007)
Published in IEEE transactions on nuclear science (01.12.2007)
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Journal Article
Investigation of Single-Event Transients in Linear Voltage Regulators
Irom, F., Miyahira, T.F., Adell, P.C., Laird, J.S., Conder, B., Pouget, V., Essely, F.
Published in IEEE transactions on nuclear science (01.12.2008)
Published in IEEE transactions on nuclear science (01.12.2008)
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Journal Article
Total dose effects in a linear Voltage regulator
Adell, P.C., Schrimpf, R.D., Holman, W.T., Todd, J.L., Caveriviere, S., Cizmarik, R.R., Galloway, K.F.
Published in IEEE transactions on nuclear science (01.12.2004)
Published in IEEE transactions on nuclear science (01.12.2004)
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Journal Article
Temperature Response on NPN and PNP Bipolar Junction Transistors after Total Ionizing Dose Irradiation Exposure
Privat, A., Barnaby, H. J., Tolleson, B. S., Muthuseenu, K., Adell, P.C.
Published in 2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2019)
Published in 2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2019)
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Conference Proceeding
Total-dose and single-event effects in DC/DC converter control circuitry
Adell, P.C., Schrimpf, R.D., Holman, W.T., Boch, J., Stacey, J., Ribero, P., Sternberg, A., Galloway, K.F.
Published in IEEE transactions on nuclear science (01.12.2003)
Published in IEEE transactions on nuclear science (01.12.2003)
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Journal Article
Total-dose and single-event effects in switching DC/DC power converters
Adell, P.C., Schrimpf, R.D., Choi, B.K., Holman, W.T., Attwood, J.P., Cirba, C.R., Galloway, K.F.
Published in IEEE transactions on nuclear science (01.12.2002)
Published in IEEE transactions on nuclear science (01.12.2002)
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Journal Article
Single event transient propagation through digital optocouplers
Adell, P.C., Mion, O., Schrimpf, R.D., Chatry, C., Calvel, P., Melotte, M.R.
Published in IEEE transactions on nuclear science (01.08.2005)
Published in IEEE transactions on nuclear science (01.08.2005)
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Journal Article
Investigations on heavy ion induced Single-Event Transients (SETs) in highly-scaled FinFETs
Gaillardin, M., Raine, M., Paillet, P., Adell, P.C., Girard, S., Duhamel, O., Andrieu, F., Barraud, S., Faynot, O.
Published in Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms (15.12.2015)
Published in Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms (15.12.2015)
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Journal Article
Single Event-Induced Instability in Linear Voltage Regulators
Adell, P.C., Witulski, A.F., Schrimpf, R.D., Marec, R., Pouget, V., Calvel, P., Bezerra, F.
Published in IEEE transactions on nuclear science (01.12.2006)
Published in IEEE transactions on nuclear science (01.12.2006)
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Journal Article
System-level design hardening based on worst-case ASET Simulations
Boulghassoul, Y., Adell, P.C., Rowe, J.D., Massengill, L.W., Schrimpf, R.D., Sternberg, A.L.
Published in IEEE transactions on nuclear science (01.10.2004)
Published in IEEE transactions on nuclear science (01.10.2004)
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Journal Article
Analytical model of radiation response in FDSOI MOSFETS
McLain, M.L., Barnaby, H.J., Adell, P.C.
Published in 2008 IEEE International Reliability Physics Symposium (01.04.2008)
Published in 2008 IEEE International Reliability Physics Symposium (01.04.2008)
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Conference Proceeding
Single event transient effects in a voltage reference
Adell, P.C., Schrimpf, R.D., Cirba, C.R., Holman, W.T., Zhu, X., Barnaby, H.J., Mion, O.
Published in Microelectronics and reliability (01.02.2005)
Published in Microelectronics and reliability (01.02.2005)
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Journal Article