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Chang, Yao-Feng, Karpov, Ilya, Hopkins, Reed, Janosky, David, Medeiros, Jacob, Sherrill, Benjamin, Zhang, Jiahan, Huang, Yifu, Pramanik, Tanmoy, Chen, Albert, Acosta, Tony, Guler, Abdullah, O'Donnell, James A., Quintero, Pedro A, Strutt, Nathan, Golonzka, Oleg, Connor, Chris, Lee, Jack C, Hicks, Jeffrey
Published in 2021 IEEE International Reliability Physics Symposium (IRPS) (01.03.2021)
Published in 2021 IEEE International Reliability Physics Symposium (IRPS) (01.03.2021)
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Conference Proceeding
eNVM RRAM reliability performance and modeling in 22FFL FinFET technology
Chang, Yao-Feng, O'Donnell, James A., Acosta, Tony, Kotlyar, Roza, Chen, Albert, Quintero, Pedro A, Strutt, Nathan, Golonzka, Oleg, Connor, Chris, Hicks, Jeff
Published in 2020 IEEE International Reliability Physics Symposium (IRPS) (01.04.2020)
Published in 2020 IEEE International Reliability Physics Symposium (IRPS) (01.04.2020)
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Conference Proceeding