A Novel Model for Injecting Error in Probabilistic Gates
Abuelala, Mohamed A.K., Wassal, Amr, Khattab, Ahmed, Fahmy, Hossam A. H.
Published in 2019 31st International Conference on Microelectronics (ICM) (01.12.2019)
Published in 2019 31st International Conference on Microelectronics (ICM) (01.12.2019)
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