Improved test structure for on-wafer microwave characterization of components
Descamps, Philippe, Abessolo-Bidzo, Dolphin, Poirier, Patrick
Published in Microwave and optical technology letters (01.02.2011)
Published in Microwave and optical technology letters (01.02.2011)
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Journal Article
CDM Simulation Based on Tester, Package and Full Integrated Circuit Modeling: Case Study
Abessolo-Bidzo, D., Smedes, T., Huitsing, A. J.
Published in IEEE transactions on electron devices (01.11.2012)
Published in IEEE transactions on electron devices (01.11.2012)
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Journal Article
A Silicon BJT Active ESD Clamp Design in a Silicon Germanium HBT BiCMOS Technology
Abessolo-Bidzo, Dolphin, Magnee, Peter, Van Dijk, Pieter, Donkers, Johan
Published in 2021 43rd Annual EOS/ESD Symposium (EOS/ESD) (26.09.2021)
Published in 2021 43rd Annual EOS/ESD Symposium (EOS/ESD) (26.09.2021)
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Conference Proceeding
Circuit under pad active bipolar ESD clamp for RF applications
Abessolo-Bidzo, Dolphin, Thomas, Eric
Published in 2017 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.09.2017)
Published in 2017 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.09.2017)
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Conference Proceeding
SEMICONDUCTOR DIE WITH TRANSFORMER AND ESD CLAMP CIRCUIT
Kulkarni, Shailesh, Osorio Tamayo, Juan Felipe, Abessolo Bidzo, Dolphin
Year of Publication 11.04.2024
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Year of Publication 11.04.2024
Patent
SEMICONDUCTOR DIE WITH TRANSFORMER AND ESD CLAMP CIRCUIT
Kulkarni, Shailesh, Osorio Tamayo, Juan Felipe, Abessolo Bidzo, Dolphin
Year of Publication 10.04.2024
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Year of Publication 10.04.2024
Patent
ELECTROSTATIC DISCHARGE PROTECTION STRUCTURE
KLIMCZAK, Janusz, SECAREANU, Radu, ABESSOLO BIDZO, Dolphin, CLAWIN, Detlef
Year of Publication 13.03.2024
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Year of Publication 13.03.2024
Patent
ELECTROSTATIC DISCHARGE PROTECTION FOR WIRELESS DEVICE
Janssen, Erwin, Janssen, Erwin Johannes Gerardus, Abessolo Bidzo, Dolphin
Year of Publication 15.11.2023
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Year of Publication 15.11.2023
Patent
Electrostatic Discharge Protection For Wireless Device
Janssen, Erwin, Janssen, Erwin Johannes Gerardus, Abessolo Bidzo, Dolphin
Year of Publication 09.11.2023
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Year of Publication 09.11.2023
Patent
Wear out effects in ESD characterization and testing
Smedes, Theo, Abessolo-Bidzo, Dolphin
Published in 2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.09.2015)
Published in 2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.09.2015)
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Conference Proceeding
Window effects in HBM and TLP testing
Smedes, Theo, Scheucher, Wolfgang, Abessolo-Bidzo, Dolphin
Published in 2017 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.09.2017)
Published in 2017 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.09.2017)
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Conference Proceeding
Charged Device Model (CDM) and Capacitive Coupled Transmission Line Pulsing (CC-TLP) Stress Severity Study on RF IC's
Abessolo-Bidzo, Dolphin, Weber, Johannes, Kiriliouk, Victoria, Wolf, Heinrich, Verwoerd, Sheela, Jirutkova, Ellen
Published in 2020 42nd Annual EOS/ESD Symposium (EOS/ESD) (13.09.2020)
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Published in 2020 42nd Annual EOS/ESD Symposium (EOS/ESD) (13.09.2020)
Conference Proceeding
A Study of HBM and CDM Layout Simulations Tools
Abessolo-Bidzo, Dolphin, Derikx, Richard, Cappon, Paul, Zhao, Shuang
Published in 2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.09.2018)
Published in 2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.09.2018)
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Conference Proceeding
A study of the effect of remote CDM clamps in integrated circuits
Abessolo-Bidzo, Dolphin, Smedes, Theo, de Jong, Peter C.
Published in 2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.09.2015)
Published in 2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.09.2015)
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Conference Proceeding
Semiconductor die with transformer and ESD clamp circuit
OSORIO TAMAYO JUAN FELIPE, KULKARNI, SHAILESH, ABESSOLO BIDZO DOLPHIN
Year of Publication 09.04.2024
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Year of Publication 09.04.2024
Patent