by Abbati, L. Degli, Ullmann, R., Paganini, G., Coppetta, M., Zaia, L., Huard, V., Montfort, O., Cantoro, R., Insinga, G., Venini, F., Calao, P., Bernardi, P.
Published in 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (06.10.2021)