High temperature bias-stress-induced instability in power trench-gated MOSFETs
Hao, J., Rioux, M., Suliman, S.A., Awadelkarim, O.O.
Published in Microelectronics and reliability (01.02.2014)
Published in Microelectronics and reliability (01.02.2014)
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Journal Article
Extracting the Schottky barrier height from axial contacts to semiconductor nanowires
Sarpatwari, K., Dellas, N.S., Awadelkarim, O.O., Mohney, S.E.
Published in Solid-state electronics (01.07.2010)
Published in Solid-state electronics (01.07.2010)
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Journal Article
Parylene-C microfibrous thin films as phononic crystals
Chindam, Chandraprakash, Lakhtakia, Akhlesh, Awadelkarim, Osama O
Published in Journal of micromechanics and microengineering (01.07.2017)
Published in Journal of micromechanics and microengineering (01.07.2017)
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Journal Article
Minority carrier injection limited current in Re/4H-SiC Schottky diodes
Sarpatwari, K., Mohney, S. E., Ashok, S., Awadelkarim, O. O.
Published in Physica status solidi. A, Applications and materials science (01.06.2010)
Published in Physica status solidi. A, Applications and materials science (01.06.2010)
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Journal Article
Threshold-voltage bias-instability in SiC MOSFETs: effects of stress temperature and level on oxide charge buildup and recovery
Ghosh, Amartya K, Hao, Jifa, Cook, Michael, Suliman, Samia A, Wang, Xinyu, Awadelkarim, Osama O
Published in Semiconductor science and technology (01.07.2022)
Published in Semiconductor science and technology (01.07.2022)
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Journal Article
Low-Frequency Three-Terminal Charge Pumping Applied to Silicon Nanowire Field-Effect Transistors
Sarpatwari, K., Awadelkarim, O. O., Passmore, L. J., Ho, T., Kuo, M., Dellas, N. S., Mayer, T. S., Mohney, S. E.
Published in IEEE transactions on nanotechnology (01.07.2011)
Published in IEEE transactions on nanotechnology (01.07.2011)
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Journal Article
Comparison of AC and DC BTI in SiC Power MOSFETs
Ghosh, Amartya K., Awadelkarim, Osama O., Hao, Jifa, Suliman, Samia, Wang, Xinyu
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
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Conference Proceeding
Microfiber inclination, crystallinity, and water wettability of microfibrous thin-film substrates of Parylene C in relation to the direction of the monomer vapor during fabrication
Chindam, Chandraprakash, Wonderling, Nichole M., Lakhtakia, Akhlesh, Awadelkarim, Osama O., Orfali, Wasim
Published in Applied surface science (01.08.2015)
Published in Applied surface science (01.08.2015)
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Journal Article
Studies of AC BTI Stress in 4H SiC MOSFETs
Ghosh, Amartya K., Awadelkarim, Osama O., Hao, Jifa
Published in 2021 IEEE International Integrated Reliability Workshop (IIRW) (04.10.2021)
Published in 2021 IEEE International Integrated Reliability Workshop (IIRW) (04.10.2021)
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Conference Proceeding
Fowler–Nordheim and hot carrier reliabilities of U-shaped trench-gated transistors studied by three terminal charge pumping
Passmore, L.J., Sarpatwari, K., Suliman, S.A., Awadelkarim, O.O., Ridley, R., Dolny, G., Michalowicz, J., Wu, C.-T.
Published in Thin solid films (10.05.2006)
Published in Thin solid films (10.05.2006)
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Journal Article
Conference Proceeding
Studies of Bias Temperature Instabilities in 4H-SiC DMOSFETs
Ghosh, Amartya, Hao, Jifa, Cook, Michael, Kendrick, Chris, Suliman, Samia A., Hall, Gavin D.R., Kopley, Tom, Awadelkarim, Osama O.
Published in 2020 IEEE International Reliability Physics Symposium (IRPS) (01.04.2020)
Published in 2020 IEEE International Reliability Physics Symposium (IRPS) (01.04.2020)
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Conference Proceeding