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DEVICE FOR MEASURING PARAMETERS OF SURFACE CONDITIONS AT INTERFACE IN SEMICONDUCTOR HETEROJUNCTIONS
by
POLYAKOV V.I.,SU
,
PEROV P.I.,SU
,
AVDEEVA L.A
.,
SU
Year of Publication
07.01.1984
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METHOD FOR MEASURING CHARGE VALUE AT THE INTERFACE OF FILM STRUCTURES
by
IGNATOV B.G.,SU
,
POLYAKOV V.I.,SU
,
PEROV P.I.,SU
,
AVDEEVA L.A
.,
SU
Year of Publication
23.04.1982
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Patent
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chemistry
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medicine
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basic electric elements
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electric solid state devices not otherwise provided for
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electricity
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semiconductor devices
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English
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esp@cenet
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