by Munteanu, D., Autran, J.-L.
Published in IEEE transactions on nuclear science (01.08.2008)

by Aguiar, Y. Q., Wrobel, F., Autran, J.-L., Kastensmidt, F. L., Leroux, P., Saigne, F., Pouget, V., Touboul, A. D.
Published in IEEE transactions on nuclear science (01.07.2020)

by Aguiar, Y. Q., Wrobel, F., Autran, J.-L., Leroux, P., Saigne, F., Touboul, A. D., Pouget, V.
Published in IEEE transactions on nuclear science (01.07.2019)

by Aguiar, Y.Q., Wrobel, F., Autran, J.-L., Leroux, P., Saigné, F., Pouget, V., Touboul, A.D.
Published in Microelectronics and reliability (01.11.2020)

by Schvittz, R.B., Aguiar, Y.Q., Wrobel, F., Autran, J.-L., Rosa, L.S., Butzen, P.F.
Published in Microelectronics and reliability (01.11.2020)

by Aguiar, Y.Q., Wrobel, F., Autran, J.-L., Leroux, P., Saigné, F., Pouget, V., Touboul, A.D.
Published in Microelectronics and reliability (01.11.2020)

by Litaudon, X., Fantz, U., Villari, R., Toigo, V., Aumeunier, M.-H., Autran, J.-L., Batistoni, P., Belonohy, E., Bradnam, S., Cecchetto, M., Colangeli, A., Dacquait, F., Dal Bello, S., Dentan, M., De Pietri, M., Eriksson, J., Fabbri, M., Falchetto, G., Figini, L., Figueiredo, J., Flammini, D., Fonnesu, N., Frassinetti, L., Galdón-Quiroga, J., Garcia-Alia, R., Garcia-Munoz, M., Ghani, Z., Gonzalez-Martin, J., Grelier, E., Di Grazia, L., Grove, B., Grove, C.L., Gusarov, A., Heinemann, B., Hjalmarsson, A., Hyvärinen, O., Ioannou-Sougleridis, V., Jones, L., Kim, H.-T., Kłosowski, M., Kocan, M., Kos, B., Kos, L., Kotnik, D., Laszynska, E., Leichtle, D., Lengar, I., Leon-Gutierrez, E., López-Revelles, A.J., Loreti, S., Loughlin, M., Marcuzzi, D., Mcclements, K.G., Mariano, G., Mattei, M., Mergia, K., Mietelski, J., Mitteau, R., Moindjie, S., Munteanu, D., Naish, R., Noce, S., Packer, L.W., Pamela, S., Pampin, R., Pau, A., Peacock, A., Peluso, E., Peneliau, Y., Peric, J., Radulović, V., Ricci, D., Rimini, F., Sanchis-Sanchez, L., Sauvan, P., Savva, M.I., Serianni, G., Shand, C.R., Snicker, A., Snoj, L., Stamatelatos, I.E., Štancar, Ž., Terranova, N., Vasilopoulou, T., Vila, R., Waterhouse, J., Wimmer, C., Wünderlich, D., Žohar, A.
Published in Nuclear fusion (01.11.2024)

by Aguiar, Y.Q., Wrobel, F., Guagliardo, S., Autran, J.-L., Leroux, P., Saigné, F., Touboul, A.D., Pouget, V.
Published in Microelectronics and reliability (01.09.2019)

by Aguiar, Y.Q., Wrobel, F., Autran, J.-L., Leroux, P., Saigné, F., Touboul, A.D., Pouget, V.
Published in Microelectronics and reliability (01.09.2018)

by Autran, J.L., Munteanu, D., Roche, P., Gasiot, G.
Published in Microelectronics and reliability (01.08.2014)

by Guagliardo, S., Wrobel, F., Aguiar, Y.Q., Autran, J.-L., Leroux, P., Saigné, F., Pouget, V., Touboul, A.D.
Published in Microelectronics and reliability (01.04.2021)

by Autran, J. L., Serre, S., Semikh, S., Munteanu, D., Gasiot, G., Roche, P.
Published in IEEE transactions on nuclear science (01.12.2012)

by Serre, S., Semikh, S., Uznanski, S., Autran, J. L., Munteanu, D., Gasiot, G., Roche, P.
Published in IEEE transactions on nuclear science (01.08.2012)

by Roche, P., Gasiot, G., Autran, J. L., Munteanu, D., Reed, R. A., Weller, R. A.
Published in IEEE transactions on nuclear science (01.06.2014)

by Munteanu, D., Autran, J. L.
Published in IEEE transactions on nuclear science (01.12.2012)

by Autran, J. L., Munteanu, D.
Published in IEEE transactions on nuclear science (01.01.2024)

by Munteanu, D., Autran, J.-L.
Published in IEEE transactions on nuclear science (01.08.2009)

by Semikh, S., Serre, S., Autran, J. L., Munteanu, D., Sauze, S., Yakushev, E., Rozov, S.
Published in IEEE transactions on nuclear science (01.04.2012)

by Autran, J. L., Munteanu, D.
Published in Journal of applied physics (07.11.2023)

by Giot, D., Roche, P., Gasiot, G., Autran, J.-L., Harboe-Sorensen, R.
Published in IEEE transactions on nuclear science (01.08.2008)