Development of low temperature atomic force microscopy with an optical beam deflection system capable of simultaneously detecting the lateral and vertical forces
Arima, Eiji, Wen, Huanfei, Naitoh, Yoshitaka, Li, Yan Jun, Sugawara, Yasuhiro
Published in Review of scientific instruments (01.09.2016)
Published in Review of scientific instruments (01.09.2016)
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Journal Article
Separation of atomic-scale spin contrast on NiO(0 0 1) by magnetic resonance force microscopy
Arima, Eiji, Naitoh, Yoshitaka, Li, Yan Jun, Sugawara, Yasuhiro
Published in Journal of physics. Condensed matter (11.10.2017)
Published in Journal of physics. Condensed matter (11.10.2017)
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Journal Article
Magnetic force microscopy using tip magnetization modulated by ferromagnetic resonance
Arima, Eiji, Naitoh, Yoshitaka, Jun Li, Yan, Yoshimura, Satoru, Saito, Hitoshi, Nomura, Hikaru, Nakatani, Ryoichi, Sugawara, Yasuhiro
Published in Nanotechnology (27.03.2015)
Published in Nanotechnology (27.03.2015)
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Journal Article
Development of pupil divided optics with magnification correction for high NA oblique imaging
Arima, Eiji, Urano, Yuta, Honda, Toshifumi, Matsumoto, Shunichi
Published in Japanese Journal of Applied Physics (01.12.2022)
Published in Japanese Journal of Applied Physics (01.12.2022)
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Journal Article
KPFM/AFM imaging on TiO 2 (110) surface in O 2 gas
Arima, Eiji, Wen, Huan Fei, Naitoh, Yoshitaka, Li, Yan Jun, Sugawara, Yasuhiro
Published in Nanotechnology (09.03.2018)
Published in Nanotechnology (09.03.2018)
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Journal Article
Stable contrast mode on TiO2(110) surface with metal-coated tips using AFM
Li, Yan Jun, Wen, Huanfei, Zhang, Quanzhen, Adachi, Yuuki, Arima, Eiji, Kinoshita, Yukinori, Nomura, Hikaru, Ma, Zongmin, Kou, Lili, Tsukuda, Yoshihiro, Naitoh, Yoshitaka, Sugawara, Yasuhiro, Xu, Rui, Cheng, Zhihai
Published in Ultramicroscopy (01.08.2018)
Published in Ultramicroscopy (01.08.2018)
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Journal Article
DEFECT INSPECTION DEVICE
MATSUMOTO Shunichi, YAMAKAWA Hiromichi, YAMAMOTO Masaya, HONDA Toshifumi, URANO Yuta, ARIMA Eiji
Year of Publication 04.08.2022
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Year of Publication 04.08.2022
Patent
DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD
MATSUMOTO Shunichi, YAMAKAWA Hiromichi, KANAI Hisaaki, HONDA Toshifumi, URANO Yuta, ARIMA Eiji
Year of Publication 07.10.2021
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Year of Publication 07.10.2021
Patent
Spin-selective Imaging by Magnetic Exchange Force Microscopy Using Ferromagnetic Resonance
Sugawara, Yasuhiro, Arima, Eiji, Naitoh, Yoshitaka, Li, Yan Jun
Published in Microscopy (01.11.2014)
Published in Microscopy (01.11.2014)
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Journal Article
KPFM/AFM imaging on TiO2(110) surface in O2 gas
Arima, Eiji, Wen, Huan Fei, Naitoh, Yoshitaka, Li, Yan Jun, Sugawara, Yasuhiro
Published in Nanotechnology (01.02.2018)
Published in Nanotechnology (01.02.2018)
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Journal Article
Stable contrast mode on TiO 2 (110) surface with metal-coated tips using AFM
Li, Yan Jun, Wen, Huanfei, Zhang, Quanzhen, Adachi, Yuuki, Arima, Eiji, Kinoshita, Yukinori, Nomura, Hikaru, Ma, Zongmin, Kou, Lili, Tsukuda, Yoshihiro, Naitoh, Yoshitaka, Sugawara, Yasuhiro, Xu, Rui, Cheng, Zhihai
Published in Ultramicroscopy (05.04.2018)
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Published in Ultramicroscopy (05.04.2018)
Journal Article