by Arabi, Karim
Published in 2010 28th VLSI Test Symposium (VTS) (01.04.2010)

by Arabi, Karim
Published in 2014 IEEE/ACM International Symposium on Low Power Electronics and Design (ISLPED) (01.08.2014)

by APARIN VLADIMIR, ARABI KARIM
Year of Publication 17.10.2017

by Arabi, K., Saleh, R., Meng Xiongfei
Published in IEEE design & test of computers (01.05.2007)

by SETHURAM RAJAMANI, ARABI KARIM
Year of Publication 02.05.2016

by Arabi, Karim
Published in Journal of electronic testing (01.02.2010)

by Arabi, Karim
Published in Journal of electronic testing (01.02.2010)

by GOUSEV EVGENI PETROVICH, SLOBODYANYUK VOLODIMIR, ARABI KARIM
Year of Publication 24.05.2018

by SLOBODYANYUK VOLODIMIR, GOUSEV EVGENI, ARABI KARIM
Year of Publication 24.05.2018

by Reddy, Babu J.N., Tripathy, Suvranta, Vershinin, Michael, Tanenbaum, Marvin E., Xu, Jing, Mattson‐Hoss, Michelle, Arabi, Karim, Chapman, Dail, Doolin, Tory, Hyeon, Changbong, Gross, Steven P.
Published in Traffic (Copenhagen, Denmark) (01.10.2017)

by Arabi, Karim
Published in 2010 28th VLSI Test Symposium (VTS) (01.04.2010)

by SETHURAM RAJAMANI, ARABI KARIM
Year of Publication 09.08.2013

by GOUSEV EVGENI PETROVICH, SHENOY RAVINDRA VAMAN, ERTURK METE, ARABI KARIM
Year of Publication 10.05.2018

by Schopf, Tim, Arabi, Karim, Matthes, Florian
Year of Publication 20.07.2023

by Arabi, Karim
Published in Journal of electronic testing (2010)

by Arabi, Karim
Published in 2015 IEEE International Test Conference (ITC) (01.10.2015)

by Arabi, K., Kaminska, B.
Published in IEEE transactions on instrumentation and measurement (01.08.1999)

by Xiongfei Meng, Saleh, R., Arabi, K.
Published in IEEE transactions on very large scale integration (VLSI) systems (01.11.2008)

by Arabi, K., Kaminska, B.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.07.1997)

by ARABI, Karim, GOUSEV, Evgeni Petrovich, SLOBODYANYUK, Volodimir
Year of Publication 06.03.2024