Evaluation of Packaging-Induced Performance Change for Small-Scale Analog IC
Ueda, N., Nishiyama, E., Aota, H., Watanabe, H.
Published in IEEE transactions on semiconductor manufacturing (01.02.2009)
Published in IEEE transactions on semiconductor manufacturing (01.02.2009)
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Journal Article
CMOS voltage reference based on gate work function differences in poly-Si controlled by conductivity type and impurity concentration
Watanabe, H., Ando, S., Aota, H., Dainin, M., Yong-Jin Chun, Taniguchi, K.
Published in IEEE journal of solid-state circuits (01.06.2003)
Published in IEEE journal of solid-state circuits (01.06.2003)
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Journal Article
Prediction of stress-induced characteristic changes for small-scale analog IC
Ueda, N., Nishiyama, E., Aota, H., Watanabe, H.
Published in 2008 IEEE International Conference on Microelectronic Test Structures (01.03.2008)
Published in 2008 IEEE International Conference on Microelectronic Test Structures (01.03.2008)
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