Magnetic tunnel junctions for magnetic field sensor by using CoFeB sensing layer capped with MgO film
Takenaga, Takashi, Tsuzaki, Yosuke, Yoshida, Chikako, Yamazaki, Yuichi, Hatada, Akiyoshi, Nakabayashi, Masaaki, Iba, Yoshihisa, Takahashi, Atsushi, Noshiro, Hideyuki, Tsunoda, Koji, Aoki, Masaki, Furukawa, Taisuke, Fukumoto, Hiroshi, Sugii, Toshihiro
Published in Journal of applied physics (07.05.2014)
Published in Journal of applied physics (07.05.2014)
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Journal Article
Lowering the Switching Current of Resistance Random Access Memory Using a Hetero Junction Structure Consisting of Transition Metal Oxides
Kinoshita, Kentaro, Tamura, Tetsuro, Aoki, Masaki, Sugiyama, Yoshihiro, Tanaka, Hitoshi
Published in Japanese Journal of Applied Physics (01.10.2006)
Published in Japanese Journal of Applied Physics (01.10.2006)
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Journal Article
I-V measurement of NiO nanoregion during observation by transmission electron microscopy
Fujii, Takashi, Arita, Masashi, Hamada, Kouichi, Kondo, Hirofumi, Kaji, Hiromichi, Takahashi, Yasuo, Moniwa, Masahiro, Fujiwara, Ichiro, Yamaguchi, Takeshi, Aoki, Masaki, Maeno, Yoshinori, Kobayashi, Toshio, Yoshimaru, Masaki
Published in Journal of applied physics (01.03.2011)
Published in Journal of applied physics (01.03.2011)
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Journal Article
Co-Design for A64FX Manycore Processor and "Fugaku"
Sato, Mitsuhisa, Ishikawa, Yutaka, Tomita, Hirofumi, Kodama, Yuetsu, Odajima, Tetsuya, Tsuji, Miwako, Yashiro, Hisashi, Aoki, Masaki, Shida, Naoyuki, Miyoshi, Ikuo, Hirai, Kouichi, Furuya, Atsushi, Asato, Akira, Morita, Kuniki, Shimizu, Toshiyuki
Published in SC20: International Conference for High Performance Computing, Networking, Storage and Analysis (01.11.2020)
Published in SC20: International Conference for High Performance Computing, Networking, Storage and Analysis (01.11.2020)
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Conference Proceeding
Sub- \hbox\mu\hbox Reset Current of Nickel Oxide Resistive Memory Through Control of Filamentary Conductance by Current Limit of MOSFET
Sato, Yoshihiro, Tsunoda, Koji, Kinoshita, Kentaro, Noshiro, Hideyuki, Aoki, Masaki, Sugiyama, Yoshihiro
Published in IEEE transactions on electron devices (01.05.2008)
Published in IEEE transactions on electron devices (01.05.2008)
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Journal Article
Sub-100-μA Reset Current of Nickel Oxide Resistive Memory Through Control of Filamentary Conductance by Current Limit of MOSFET
SATO, Yoshihiro, TSUNODA, Koji, KINOSHITA, Kentaro, NOSHIRO, Hideyuki, AOKI, Masaki, SUGIYAMA, Yoshihiro
Published in IEEE transactions on electron devices (01.05.2008)
Published in IEEE transactions on electron devices (01.05.2008)
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Journal Article
Reliability of MgO Tunneling Barrier for MRAM Device
Yoshida, C., Noshiro, H., Yamazaki, Y., Iizuka, T., Stoh, Y., Aoki, M., Umehara, S., Satoh, M., Kobayashi, K.
Published in 2006 IEEE International Reliability Physics Symposium Proceedings (01.01.2006)
Published in 2006 IEEE International Reliability Physics Symposium Proceedings (01.01.2006)
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Conference Proceeding
ASPHALT MODIFIER
TAKAHASHI NOBUTAKE, KOYANAGI TOMOKO, AOKI MASAKI, YAKEYAMA AKIO, YUKAWA SEIJIRO
Year of Publication 16.09.2021
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Year of Publication 16.09.2021
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