Impact of nonuniform graded dopant profile in polysilicon gate on gate leakage current
Sarkar, M., Ang Chew Hoe, Huang Jiayi, Chen, T.P.
Published in IEEE transactions on electron devices (01.06.2005)
Published in IEEE transactions on electron devices (01.06.2005)
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Journal Article
Negative Bias Temperature Instability on Plasma-Nitrided Silicon Dioxide Film
Ang, Chew-Hoe, Lek, Chun-Meng, Tan, Shyue-Seng, Cho, Byung-Jin, Chen, Tupei, Lin, Wenhe, Zhen, Jia-Zheng
Published in Japanese Journal of Applied Physics (15.03.2002)
Published in Japanese Journal of Applied Physics (15.03.2002)
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Journal Article
INFLUENCE OF NITROGEN PROXIMITY FROM THE Si/SiO2 INTERFACE ON NEGATIVE BIAS TEMPERATURE INSTABILITY
Tan, S S, Chen, T P, Ang, C H, Tan, Y L, Chan, L
Published in Japanese Journal of Applied Physics, Part 1 (01.10.2002)
Published in Japanese Journal of Applied Physics, Part 1 (01.10.2002)
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Journal Article
Bias and thermal annealings of radiation-induced leakage currents in thin-gate oxides
Ang, Chew-Hoe, Ling, Chung-Ho, Cheng, Zhi-Yuan, Kim, Sun-June, Cho, Byung-Jin
Published in IEEE transactions on nuclear science (01.12.2000)
Published in IEEE transactions on nuclear science (01.12.2000)
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Journal Article
Power-Law Dependence of Charge Trapping on Injected Charge in Very Thin SiO2 Films
Liu, Yang, Chen, Tu Pei, Ang, Chew-Hoe, Fung, Steve
Published in Japanese Journal of Applied Physics (01.04.2002)
Published in Japanese Journal of Applied Physics (01.04.2002)
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Journal Article
A Differential CMOS T/R Switch for Multistandard Applications
Zhang, Y.P., Qiang Li, Wei Fan, Chew Hoe Ang, He Li
Published in IEEE transactions on circuits and systems. II, Express briefs (01.08.2006)
Published in IEEE transactions on circuits and systems. II, Express briefs (01.08.2006)
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Journal Article
Influences of Nitridation on Barrier Height Change Caused by Electrical Stress
Tan, Shyue Seng, Chen, Tu Pei, Ang, Chew Hoe
Published in Japanese Journal of Applied Physics (15.12.2002)
Published in Japanese Journal of Applied Physics (15.12.2002)
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Journal Article
Mechanism of nitrogen-enhanced negative bias temperature instability in pMOSFET
Tan, Shyue Seng, Chen, Tu Pei, Ang, Chew Hoe, Chan, Lap
Published in Microelectronics and reliability (2005)
Published in Microelectronics and reliability (2005)
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Journal Article
Localized oxide degradation in ultrathin gate dielectric and its statistical analysis
Wei Yip Loh, Byung Jin Cho, Ming Fu Li, Chan, D.S.H., Chew Hoe Ang, Jia Zhen Zheng, Dim Lee Kwong
Published in IEEE transactions on electron devices (01.04.2003)
Published in IEEE transactions on electron devices (01.04.2003)
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Journal Article
Impact of decoupled plasma nitridation of ultra-thin gate oxide on the performance of p-channel MOSFETs
Lek, Chun Meng, Cho, Byung Jin, Ang, Chew Hoe, Tan, Shyue Seng, Loh, Wei Yip, Zhen, Jia Zheng, Lap, Chan
Published in Semiconductor science and technology (01.06.2002)
Published in Semiconductor science and technology (01.06.2002)
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Journal Article
The impact of post-polysilicon gate process on ultra-thin gate oxide integrity
Ang, Chew-Hoe, Ko, Lian-Hoon, Lin, Wenhe, Zheng, Jia-Zhen
Published in Solid-state electronics (01.02.2002)
Published in Solid-state electronics (01.02.2002)
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Journal Article
Radiation and electrical stress-induced hole trap-assisted tunneling currents in ultrathin gate oxides
Ang, Chew-Hoe, Ling, Chung-Ho, Cho, Byung-Jin, Kim, Sun-Jung, Cheng, Zhi-Yuan
Published in Solid-state electronics (01.11.2000)
Published in Solid-state electronics (01.11.2000)
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Journal Article
Effects of post-decoupled-plasma-nitridation annealing of ultra-thin gate oxide
Lek, C.-M., Byung Jin Cho, Wei Yip Loh, Chew-Hoe Ang, Wenhe Lin, Yun-Ling Tan, Jia-Zheng Zhen, Lap Chan, Shyue Seng Tan, Tu Pei Chen
Published in Proceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.02TH8614) (2002)
Published in Proceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.02TH8614) (2002)
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