Ice state evolution during spring in Richardson crater, Mars
Andrieu, François, Schmidt, Frédéric, Douté, Sylvain, Chassefière, Eric
Published in Icarus (New York, N.Y. 1962) (15.11.2018)
Published in Icarus (New York, N.Y. 1962) (15.11.2018)
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Journal Article
Powering AI at the edge: A robust, memristor-based binarized neural network with near-memory computing and miniaturized solar cell
Jebali, Fadi, Majumdar, Atreya, Turck, Clément, Harabi, Kamel-Eddine, Faye, Mathieu-Coumba, Muhr, Eloi, Walder, Jean-Pierre, Bilousov, Oleksandr, Michaud, Amadéo, Vianello, Elisa, Hirtzlin, Tifenn, Andrieu, François, Bocquet, Marc, Collin, Stéphane, Querlioz, Damien, Portal, Jean-Michel
Published in Nature communications (25.01.2024)
Published in Nature communications (25.01.2024)
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Journal Article
Radiative transfer model for contaminated rough slabs
Andrieu, François, Douté, Sylvain, Schmidt, Frédéric, Schmitt, Bernard
Published in Applied optics. Optical technology and biomedical optics (01.11.2015)
Published in Applied optics. Optical technology and biomedical optics (01.11.2015)
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Journal Article
On the Variability in Planar FDSOI Technology: From MOSFETs to SRAM Cells
Mazurier, J., Weber, O., Andrieu, F., Toffoli, A., Rozeau, O., Poiroux, T., Allain, F., Perreau, P., Fenouillet-Beranger, C., Thomas, O., Belleville, M., Faynot, O.
Published in IEEE transactions on electron devices (01.08.2011)
Published in IEEE transactions on electron devices (01.08.2011)
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Journal Article
Experimental developments of A2RAM memory cells on SOI and bulk substrates
Rodriguez, Noel, Gamiz, Francisco, Navarro, Carlos, Marquez, Carlos, Andrieu, François, Faynot, Olivier, Cristoloveanu, Sorin
Published in Solid-state electronics (01.01.2015)
Published in Solid-state electronics (01.01.2015)
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Journal Article
Carrier-Mobility Enhancement via Strain Engineering in Future Thin-Body MOSFETs
Nuo Xu, Ho, Byron, Andrieu, F., Smith, L., Bich-Yen Nguyen, Weber, O., Poiroux, T., Faynot, O., Tsu-Jae King Liu
Published in IEEE electron device letters (01.03.2012)
Published in IEEE electron device letters (01.03.2012)
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Journal Article
Experimental Investigation of the Tunneling Injection Boosters for Enhanced ION ETSOI Tunnel FET
VILLALON, Anthony, LE ROYER, Cyrille, CASSE, Mikaël, COOPER, David, HARTMANN, Jean-Michel, ALLAIN, Fabienne, TABONE, Claude, ANDRIEU, François, CRISTOLOVEANU, Sorin
Published in IEEE transactions on electron devices (01.12.2013)
Published in IEEE transactions on electron devices (01.12.2013)
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Journal Article
Bias-Engineered Mobility in Advanced FD-SOI MOSFETs
Fernandez, Cristina, Rodriguez, Noel, Ohata, Akiko, Gamiz, Francisco, Andrieu, Francois, Fenouillet-Beranger, Claire, Faynot, Olivier, Cristoloveanu, Sorin
Published in IEEE electron device letters (01.07.2013)
Published in IEEE electron device letters (01.07.2013)
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Journal Article
Carrier transport in HfO2/metal gate MOSFETs : Physical insight into critical parameters
CASSE, Mikaël, THEVENOD, Laurent, BILLON, Thierry, MOUIS, Mireille, BOULANGER, Fabien, GUILLAUMOT, Bernard, TOSTI, Lucie, MARTIN, Francois, MITARD, Jérome, WEBER, Olivier, ANDRIEU, Francois, ERNST, Thomas, REIMBOLD, Gilles
Published in IEEE transactions on electron devices (01.04.2006)
Published in IEEE transactions on electron devices (01.04.2006)
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Journal Article
High-Performance Ultrathin Body c-SiGe Channel FDSOI pMOSFETs Featuring SiGe Source and Drain: Vth Tuning, Variability, Access Resistance, and Mobility Issues
VILLALON, Anthony, LE ROYER, Cyrille, SCHEIBLIN, Pascal, ALLAIN, Fabienne, ANDRIEU, François, WEBER, Olivier, FAYNOT, Olivier, CRISTOLOVEANU, Sorin, CASSE, Mickael, COOPER, David, MAZURIER, Jérome, PREVITALI, Bernard, TABONE, Claude, PERREAU, Pierre, HARTMANN, Jean-Michel
Published in IEEE transactions on electron devices (01.05.2013)
Published in IEEE transactions on electron devices (01.05.2013)
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Journal Article
Determination of volumetric abundance of intimate mixture using Bayesian MCMC
Schmidt, Frederic, Koirala, Bikram, Andrieu, Francois
Published in IEEE sensors journal (24.09.2024)
Published in IEEE sensors journal (24.09.2024)
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Journal Article
Formation of recurring slope lineae on Mars by rarefied gas-triggered granular flows
Schmidt, Frédéric, Andrieu, François, Costard, François, Kocifaj, Miroslav, Meresescu, Alina G.
Published in Nature geoscience (01.04.2017)
Published in Nature geoscience (01.04.2017)
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Journal Article
Fabrication and mobility characteristics of SiGe surface channel pMOSFETs with a HfO2/TiN gate stack
WEBER, Olivier, DAMLENCOURT, Jean-Francois, ANDRIEU, Francois, DUCROQUET, Frédérique, ERNST, Thomas, HARTMANN, Jean-Michel, PAPON, Anne-Marie, RENAULT, Olivier, GUILLAUMOT, Bernard, DELEONIBUS, Simon
Published in IEEE transactions on electron devices (01.03.2006)
Published in IEEE transactions on electron devices (01.03.2006)
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Journal Article
Study of substrate orientations impact on Ultra Thin Buried Oxide (UTBOX) FDSOI High-K Metal gate technology performances
Ben Akkez, Imed, Fenouillet-Beranger, Claire, Cros, Antoine, Perreau, Pierre, Haendler, Sébatien, Weber, Olivier, Andrieu, François, Pellissier-Tanon, D., Abbate, F., Richard, C., Beneyton, R., Gouraud, P., Margain, A., Borowiak, C., Gourvest, E., Bourdelle, K.K., Nguyen, B.Y., Poiroux, T., Skotnicki, Thomas, Faynot, Olivier, Balestra, Francis, Ghibaudo, Gérard, Boeuf, Fréderic
Published in Solid-state electronics (01.12.2013)
Published in Solid-state electronics (01.12.2013)
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Journal Article
Conference Proceeding
Multilayered Sb-Rich GeSbTe Phase-Change Memory for Best Endurance and Reduced Variability
Lama, Giusy, Bernard, Mathieu, Bourgeois, Guillaume, Garrione, Julien, Meli, Valentina, Castellani, Niccolo, Sabbione, Chiara, Prazakova, Lucie, Fernandez Rodas, Diana-Stephany, Nolot, Emmanuel, Cyrille, Marie Claire, Andrieu, Francois, Navarro, Gabriele
Published in IEEE transactions on electron devices (01.08.2022)
Published in IEEE transactions on electron devices (01.08.2022)
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Journal Article
In-depth characterization of the hole mobility in 50-nm process-induced strained MOSFETs
Andrieu, F., Ernst, T., Ravit, C., Jurczak, M., Ghibaudo, G., Deleonibus, S.
Published in IEEE electron device letters (01.10.2005)
Published in IEEE electron device letters (01.10.2005)
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Journal Article