Impact of Hot Carriers on nMOSFET Variability in 45- and 65-nm CMOS Technologies
Magnone, P., Crupi, F., Wils, N., Jain, R., Tuinhout, H., Andricciola, P., Giusi, G., Fiegna, C.
Published in IEEE transactions on electron devices (01.08.2011)
Published in IEEE transactions on electron devices (01.08.2011)
Get full text
Journal Article
Parametric Mismatch Characterization for Mixed-Signal Technologies
Tuinhout, Hans, Wils, Nicole, Andricciola, Pietro
Published in IEEE journal of solid-state circuits (01.09.2010)
Published in IEEE journal of solid-state circuits (01.09.2010)
Get full text
Journal Article
Mismatch sources in LDMOS devices
Andricciola, Pietro, Tuinhout, Hans
Published in 2010 Proceedings of the European Solid State Device Research Conference (01.09.2010)
Published in 2010 Proceedings of the European Solid State Device Research Conference (01.09.2010)
Get full text
Conference Proceeding
FinFET Mismatch in Subthreshold Region: Theory and Experiments
Magnone, Paolo, Crupi, Felice, Mercha, Abdelkarim, Andricciola, Pietro, Tuinhout, Hans, Lander, Robert J P
Published in IEEE transactions on electron devices (01.11.2010)
Published in IEEE transactions on electron devices (01.11.2010)
Get full text
Journal Article
Impact of Hot Carriers on nMOSFET Variability in 45- and 65-nm CMOS Technologies : CHARACTERIZATION OF NANO CMOS VARIABIALITY BY SIMULATION AND MEASUREMENTS
MAGNONE, Paolo, CRUPI, Felice, WILS, Nicole, JAIN, Ruchil, TUINHOUT, Hans, ANDRICCIOLA, Pietro, GIUSI, Gino, FIEGNA, Claudio
Published in IEEE transactions on electron devices (2011)
Get full text
Published in IEEE transactions on electron devices (2011)
Journal Article
Methodology to evaluate long channel matching deterioration and effects of transistor segmentation on MOSFET matching
Tuinhout, Hans, Wils, Nicole, Meijer, Maurice, Andricciola, Pietro
Published in 2010 International Conference on Microelectronic Test Structures (ICMTS) (01.03.2010)
Published in 2010 International Conference on Microelectronic Test Structures (ICMTS) (01.03.2010)
Get full text
Conference Proceeding
Microsecond pulsed DC matching measurements on MOSFETs in strong and weak inversion
Andricciola, P., Tuinhout, H., Wils, N., Schmitz, J.
Published in 2011 IEEE ICMTS International Conference on Microelectronic Test Structures (01.04.2011)
Published in 2011 IEEE ICMTS International Conference on Microelectronic Test Structures (01.04.2011)
Get full text
Conference Proceeding