Detailed analysis of IC packages using thermal transient testing and CFD modelling for communication device applications
Fang Yake, Wang Gang, Xiaodan Chen, Wong Voon Hon, Xing Fu, Andras, Vass-Varnai
Published in 2016 22nd International Workshop on Thermal Investigations of ICs and Systems (THERMINIC) (01.09.2016)
Published in 2016 22nd International Workshop on Thermal Investigations of ICs and Systems (THERMINIC) (01.09.2016)
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Conference Proceeding
Package hermeticity testing with thermal transient measurements
Vass-Várnai, András, Rencz, Márta
Published in Microsystem technologies : sensors, actuators, systems integration (01.08.2009)
Published in Microsystem technologies : sensors, actuators, systems integration (01.08.2009)
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Journal Article
Usage of porous Al2O3 layers for RH sensing
Timár-Horváth, Veronika, Juhász, László, Vass-Várnai, András, Perlaky, Gergely
Published in Microsystem technologies (01.07.2008)
Published in Microsystem technologies (01.07.2008)
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Journal Article
Conference Proceeding
Investigation of die-attach degradation using power cycling tests
Sarkany, Zoltan, Vass-Varnai, Andras, Rencz, Marta
Published in 2013 IEEE 15th Electronics Packaging Technology Conference (EPTC 2013) (01.12.2013)
Published in 2013 IEEE 15th Electronics Packaging Technology Conference (EPTC 2013) (01.12.2013)
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Conference Proceeding
Highly diastereoselective Michael reaction under solvent-free conditions using microwaves: conjugate addition of flavanone to its chalcone precursor
Patonay, Tamás, Varma, Rajender S, Vass, András, Lévai, Albert, Dudás, József
Published in Tetrahedron letters (19.02.2001)
Published in Tetrahedron letters (19.02.2001)
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Journal Article
Reliability testing of TIM materials with thermal transient measurements
Vass-Varnai, A., Sarkany, Z., Rencz, M.
Published in 2009 11th Electronics Packaging Technology Conference (01.12.2009)
Published in 2009 11th Electronics Packaging Technology Conference (01.12.2009)
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Conference Proceeding
Automated structure function object mapping
Blackmore, Byron, Bornoff, Robin, Proulx, Joe, Vass-Varnai, Andras
Published in 2018 34th Thermal Measurement, Modeling & Management Symposium (SEMI-THERM) (01.03.2018)
Published in 2018 34th Thermal Measurement, Modeling & Management Symposium (SEMI-THERM) (01.03.2018)
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Conference Proceeding
Effect of power cycling parameters on predicted IGBT lifetime
Sarkany, Zoltan, Vass-Varnai, Andras, Rencz, Marta
Published in 2015 IEEE Aerospace Conference (01.03.2015)
Published in 2015 IEEE Aerospace Conference (01.03.2015)
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Conference Proceeding
Thermal transient analysis of semiconductor device degradation in power cycling reliability tests with variable control strategies
Sarkany, Zoltan, Vass-Varnai, Andras, Laky, Sandor, Rencz, Marta
Published in 2014 Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) (01.03.2014)
Published in 2014 Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) (01.03.2014)
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Conference Proceeding
A detailed IC package numerical model calibration methodology
Bornoff, R., Vass-Varnai, A.
Published in 29th IEEE Semiconductor Thermal Measurement and Management Symposium (01.03.2013)
Published in 29th IEEE Semiconductor Thermal Measurement and Management Symposium (01.03.2013)
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Conference Proceeding
Tackling reliability of power module
He, Weikun Jimmy, Vass-Varnai, Andras, Wilson, John
Published in 2015 IEEE Applied Power Electronics Conference and Exposition (APEC) (01.03.2015)
Published in 2015 IEEE Applied Power Electronics Conference and Exposition (APEC) (01.03.2015)
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Conference Proceeding
Lifetime estimation of power electronics modules considering the target application
Szel, Attila, Sarkany, Zoltan, Bein, Marton, Bornoff, Robin, Vass-Varnai, Andras, Rencz, Marta
Published in 2015 31st Thermal Measurement, Modeling & Management Symposium (SEMI-THERM) (01.03.2015)
Published in 2015 31st Thermal Measurement, Modeling & Management Symposium (SEMI-THERM) (01.03.2015)
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Conference Proceeding
Possibilities of humidity sensing with thermal transient testing on porous structures
Vass-Varnai, A., Furjes, P., Rencz, M.
Published in 2008 14th International Workshop on Thermal Inveatigation of ICs and Systems (01.09.2008)
Published in 2008 14th International Workshop on Thermal Inveatigation of ICs and Systems (01.09.2008)
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Conference Proceeding