Data-driven RRAM device models using Kriging interpolation
Hossen, Imtiaz, Anders, Mark A, Wang, Lin, Adam, Gina C
Published in Scientific reports (08.04.2022)
Published in Scientific reports (08.04.2022)
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Journal Article
An All-Digital Unified Physically Unclonable Function and True Random Number Generator Featuring Self-Calibrating Hierarchical Von Neumann Extraction in 14-nm Tri-gate CMOS
Satpathy, Sudhir K., Mathew, Sanu K., Kumar, Raghavan, Suresh, Vikram, Anders, Mark A., Kaul, Himanshu, Agarwal, Amit, Hsu, Steven, Krishnamurthy, Ram K., De, Vivek
Published in IEEE journal of solid-state circuits (01.04.2019)
Published in IEEE journal of solid-state circuits (01.04.2019)
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Journal Article
2.4 Gbps, 7 mW All-Digital PVT-Variation Tolerant True Random Number Generator for 45 nm CMOS High-Performance Microprocessors
Mathew, S. K., Srinivasan, S., Anders, M. A., Kaul, H., Hsu, S. K., Sheikh, F., Agarwal, A., Satpathy, S., Krishnamurthy, R. K.
Published in IEEE journal of solid-state circuits (01.11.2012)
Published in IEEE journal of solid-state circuits (01.11.2012)
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Journal Article
A 4-fJ/b Delay-Hardened Physically Unclonable Function Circuit With Selective Bit Destabilization in 14-nm Trigate CMOS
Satpathy, Sudhir, Mathew, Sanu K., Suresh, Vikram, Anders, Mark A., Kaul, Himanshu, Agarwal, Amit, Hsu, Steven K., Chen, Gregory, Krishnamurthy, Ram K., De, Vivek K.
Published in IEEE journal of solid-state circuits (01.04.2017)
Published in IEEE journal of solid-state circuits (01.04.2017)
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Journal Article
mu RNG: A 300-950 mV, 323 Gbps/W All-Digital Full-Entropy True Random Number Generator in 14 nm FinFET CMOS
Mathew, Sanu K., Johnston, David, Satpathy, Sudhir, Suresh, Vikram, Newman, Paul, Anders, Mark A., Kaul, Himanshu, Agarwal, Amit, Hsu, Steven K., Chen, Gregory, Krishnamurthy, Ram K.
Published in IEEE journal of solid-state circuits (01.07.2016)
Published in IEEE journal of solid-state circuits (01.07.2016)
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Journal Article
A 7-Gbps SCA-Resistant Multiplicative-Masked AES Engine in Intel 4 CMOS
Kumar, Raghavan, Suresh, Vikram B., Taneja, Sachin, Anders, Mark A., Hsu, Steven, Agarwal, Amit, De, Vivek, Mathew, Sanu K.
Published in IEEE journal of solid-state circuits (01.04.2023)
Published in IEEE journal of solid-state circuits (01.04.2023)
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Journal Article
A Time-/Frequency-Domain Side-Channel Attack Resistant AES-128 and RSA-4K Crypto-Processor in 14-nm CMOS
Kumar, Raghavan, Liu, Xiaosen, Suresh, Vikram, Krishnamurthy, Harish K., Satpathy, Sudhir, Anders, Mark A., Kaul, Himanshu, Ravichandran, Krishnan, De, Vivek, Mathew, Sanu K.
Published in IEEE journal of solid-state circuits (01.04.2021)
Published in IEEE journal of solid-state circuits (01.04.2021)
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Journal Article
53 Gbps Native (2 ^) ^ Composite-Field AES-Encrypt/Decrypt Accelerator for Content-Protection in 45 nm High-Performance Microprocessors
Mathew, S K, Sheikh, F, Kounavis, M, Gueron, S, Agarwal, A, Hsu, S K, Kaul, H, Anders, M A, Krishnamurthy, R K
Published in IEEE journal of solid-state circuits (01.04.2011)
Published in IEEE journal of solid-state circuits (01.04.2011)
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Journal Article
Nonresonant Transmission Line Probe for Sensitive Interferometric Electron Spin Resonance Detection
Shrestha, Pragya R, Abhyankar, Nandita, Anders, Mark A, Cheung, Kin P, Gougelet, Robert, Ryan, Jason T, Szalai, Veronika, Campbell, Jason P
Published in Analytical chemistry (Washington) (03.09.2019)
Published in Analytical chemistry (Washington) (03.09.2019)
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Journal Article
Effects of nitrogen on the interface density of states distribution in 4H-SiC metal oxide semiconductor field effect transistors: Super-hyperfine interactions and near interface silicon vacancy energy levels
Anders, Mark A., Lenahan, Patrick M., Edwards, Arthur H., Schultz, Peter A., Van Ginhoven, Renee M.
Published in Journal of applied physics (14.11.2018)
Published in Journal of applied physics (14.11.2018)
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Journal Article
Relationship Between the 4H-SiC/SiO2 Interface Structure and Electronic Properties Explored by Electrically Detected Magnetic Resonance
Anders, Mark A., Lenahan, Patrick M., Cochrane, Corey J., Lelis, Aivars J.
Published in IEEE transactions on electron devices (01.02.2015)
Published in IEEE transactions on electron devices (01.02.2015)
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Journal Article
Slow- and rapid-scan frequency-swept electrically detected magnetic resonance of MOSFETs with a non-resonant microwave probe within a semiconductor wafer-probing station
McCrory, Duane J, Anders, Mark A, Ryan, Jason T, Shrestha, Pragya R, Cheung, Kin P, Lenahan, Patrick M, Campbell, Jason P
Published in Review of scientific instruments (01.01.2019)
Published in Review of scientific instruments (01.01.2019)
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Journal Article
An 8.3-to-18Gbps Reconfigurable SCA-Resistant/Dual-Core/Blind-Bulk AES Engine in Intel 4 CMOS
Kumar, Raghavan, Suresh, Vikram B., Anders, Mark A., Hsu, Steven K., Agarwal, Amit, De, Vivek K., Mathew, Sanu K.
Published in 2022 IEEE International Solid- State Circuits Conference (ISSCC) (20.02.2022)
Published in 2022 IEEE International Solid- State Circuits Conference (ISSCC) (20.02.2022)
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Conference Proceeding
Magnetic Field Sensing with Atomic Scale Defects in SiC Devices
Lenahan, Patrick M., Anders, Mark A., Cochrane, Corey J., Blacksberg, Jordana
Published in Materials Science Forum (24.05.2016)
Published in Materials Science Forum (24.05.2016)
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Journal Article
A Surprising Result: “Bulk” SiC Defects in the Negative Bias Instability in 4H-SiC MOSFETs
Lelis, Aivars J., Anders, Mark A., Lenahan, Patrick M.
Published in Materials Science Forum (24.05.2016)
Published in Materials Science Forum (24.05.2016)
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Journal Article
A 617-TOPS/W All-Digital Binary Neural Network Accelerator in 10-nm FinFET CMOS
Knag, Phil C., Chen, Gregory K., Sumbul, H. Ekin, Kumar, Raghavan, Hsu, Steven K., Agarwal, Amit, Kar, Monodeep, Kim, Seongjong, Anders, Mark A., Kaul, Himanshu, Krishnamurthy, Ram K.
Published in IEEE journal of solid-state circuits (01.04.2021)
Published in IEEE journal of solid-state circuits (01.04.2021)
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Journal Article