Search Results - "ANCHLIA, Ankur" :: K.UTB vyhledávací portál | TBU Library Retrieval Portal

A novel structure of MOSFET array to measure ioff-ion with high accuracy and high density

A novel structure of MOSFET array to measure ioff-ion with high accuracy and high density

by Suzuki, Tsuyoshi, Fukuzaki, Yuzo, Verkest, Diederik, Ohnuma, Hidetoshi, Anchlia, Ankur, Cherman, Vladimir, Oishi, Hidetoshi, Mori, Shigetaka, Ryckaert, Julien, Ogawa, Kazuhisa, Van der Plas, Geert, Beyne, Eric
Published in Proceedings of the 2015 International Conference on Microelectronic Test Structures (01.03.2015)

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Conference Proceeding Journal Article

SYSTEM-ON-CHIP INTERFACED WITH SENSOR FOR PROCESSING SENSOR OUTPUT SIGNALS

SYSTEM-ON-CHIP INTERFACED WITH SENSOR FOR PROCESSING SENSOR OUTPUT SIGNALS

by ANCHLIA, Ankur
Year of Publication 30.07.2020

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Patent

MULTI-MODE INFRARED PHOTODETECTOR

MULTI-MODE INFRARED PHOTODETECTOR

by ANCHLIA, Ankur
Year of Publication 02.04.2020

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Patent

GLARE-RESISTANT LIDAR

GLARE-RESISTANT LIDAR

by FINKELSTEIN, Hod, BRONSTEIN, Noah, ANCHLIA, Ankur, STOCKTON, John, STEINHARDT, Allan
Year of Publication 15.02.2024

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Patent

Methods for characterization of electronic circuits under process variability effects

Methods for characterization of electronic circuits under process variability effects

by Miranda, Miguel, Dierickx, Bart, Anchlia, Ankur
Year of Publication 09.10.2012

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Patent

Methods for characterization of electronic circuits under process variability effects

Methods for characterization of electronic circuits under process variability effects

by DIERICKX BART, MIRANDA MIGUEL, ANCHLIA ANKUR
Year of Publication 09.10.2012

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Patent

Method and system for measuring capacitance difference between capacitive elements

Method and system for measuring capacitance difference between capacitive elements

by Mercha Abdelkarim, Van der Plas Geert, Anchlia Ankur, Miyamori Yuichi, Sawada Ken
Year of Publication 09.08.2016

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Patent

METHOD AND SYSTEM FOR MEASURING CAPACITANCE DIFFERENCE BETWEEN CAPACITIVE ELEMENTS

METHOD AND SYSTEM FOR MEASURING CAPACITANCE DIFFERENCE BETWEEN CAPACITIVE ELEMENTS

by ANCHLIA, ANKUR, MIYAMORI, YUICHI, MERCHA, ABDELKARIM, SAWADA, KEN, VAN DER PLAS, GEERT
Year of Publication 25.11.2015

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Patent

METHOD AND SYSTEM FOR MEASURING CAPACITANCE DIFFERENCE BETWEEN CAPACITIVE ELEMENTS

METHOD AND SYSTEM FOR MEASURING CAPACITANCE DIFFERENCE BETWEEN CAPACITIVE ELEMENTS

by SAWADA KEN, MIYAMORI YUICHI, VAN DER PLAS GEERT, MERCHA ABDELKARIM, ANCHLIA ANKUR
Year of Publication 18.12.2014

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Patent

METHOD AND SYSTEM FOR MEASURING CAPACITANCE DIFFERENCE BETWEEN CAPACITIVE ELEMENTS

METHOD AND SYSTEM FOR MEASURING CAPACITANCE DIFFERENCE BETWEEN CAPACITIVE ELEMENTS

by ANCHLIA, ANKUR, MIYAMORI, YUICHI, MERCHA, ABDELKARIM, SAWADA, KEN, VAN DER PLAS, GEERT
Year of Publication 29.10.2014

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Patent

METHODS FOR CHARACTERIZATION OF ELECTRONIC CIRCUITS UNDER PROCESS VARIABILITY EFFECTS

METHODS FOR CHARACTERIZATION OF ELECTRONIC CIRCUITS UNDER PROCESS VARIABILITY EFFECTS

by DIERICKX BART, MIRANDA MIGUEL, ANCHLIA ANKUR
Year of Publication 29.01.2009

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Patent

Methods for characterization of electronic circuits under process variability effects

Methods for characterization of electronic circuits under process variability effects

by ANCHLIA, ANKUR, DIERICKX, BART, MIRANDA, MIGUEL
Year of Publication 24.12.2008

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Patent

METHOD AND SYSTEM FOR MEASURING CAPACITANCE DIFFERENCE BETWEEN CAPACITIVE ELEMENTS

METHOD AND SYSTEM FOR MEASURING CAPACITANCE DIFFERENCE BETWEEN CAPACITIVE ELEMENTS

by ANCHLIA, ANKUR, MERCHA, ABDELKARIM, SAWADA, KEN, VAN DER PLAS, GEERT, MIYAMORI, YICHI
Year of Publication 27.06.2013

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Patent

METHOD AND SYSTEM FOR ANALYZING PERFORMANCE METRICS OF ARRAY TYPE CIRCUITS UNDER PROCESS VARIABILITY

METHOD AND SYSTEM FOR ANALYZING PERFORMANCE METRICS OF ARRAY TYPE CIRCUITS UNDER PROCESS VARIABILITY

by DOBROVOLNY PETR, MIRANDA CORBALAN MIGUEL, ANCHLIA ANKUR, ZUBER PAUL
Year of Publication 30.09.2010

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Patent

Method and system for analyzing performance metrics of array type circuits under process variability

Method and system for analyzing performance metrics of array type circuits under process variability

by ANCHLIA, ANKUR, ZUBER, PAUL, CORBALAN, MIGUEL MIRANDA, DOBROVOLNY, PETR
Year of Publication 29.09.2010

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Patent

A Wideband Low Power VCO for IEEE 802.11a

A Wideband Low Power VCO for IEEE 802.11a

by Anchlia, A., Sharma, D.
Published in 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings (2006)

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Conference Proceeding

Method and system for measuring capacitance difference between capacitive elements

Method and system for measuring capacitance difference between capacitive elements

by ANCHLIA, ANKUR, MIYAMORI, YUICHI, MERCHA, ABDELKARIM, SAWADA, KEN, VAN DER PLAS, GEERT
Year of Publication 01.08.2016

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Patent

Method and system for measuring capacitance difference between capacitive elements

Method and system for measuring capacitance difference between capacitive elements

by ANCHLIA, ANKUR, MIYAMORI, YUICHI, MERCHA, ABDELKARIM, SAWADA, KEN, VAN DER PLAS, GEERT
Year of Publication 01.07.2013

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Patent