Search Results - "AN YOUNG SOO" :: K.UTB vyhledávací portál

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SEMICONDUCTOR DEVICE INSPECT APPARATUS INCLUDING TEST BOARD AND POGO PIN

by AN, YOUNG SOO, KIM, CHEON SEOG, NA, JEONG GON
Year of Publication 28.06.2007

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PHOTOMASKS INCLUDING MULTI LAYERED LIGHT SHIELDING PATTERNS, MANUFACTURING METHOD THEREOF AND BLANK PHOTOMASK FOR FABRICATING THE SAME

by AN, YOUNG SOO, KIM, CHANG HWAN, LEE, SUK HO
Year of Publication 07.06.2007

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PROBE CARD

by AN, YOUNG SOO, KIM, MIN GU, CHOI, HO JEONG
Year of Publication 24.04.2007

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APPARATUS AND METHOD FOR FLUORINE-CONTAINING WASTE WATER TREATMENT

by AN, YOUNG SOO, KIM, TAE HWAN, KIM, TEA KIL, KIM, JE HUN
Year of Publication 13.04.2007

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MULTI PROBABLE PROBE CARD

by AN, YOUNG SOO, KIM, MIN GU, CHOI, HO JEONG
Year of Publication 02.03.2007

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A WIRELESS TESTING INTERFACE DEVICE, A SEMICONDUCTOR DEVICE AND A SEMICONDUCTOR PACKAGE INCLUDING THEREOF, AND A TESTING METHOD USING THEREOF

by AN, YOUNG SOO, BYUN, EUN JO, LEE, SANG HOON, CHO, CHANG HYUN, OH, SE JANG
Year of Publication 12.02.2010

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Interface device for wireless testing, semiconductor device and semiconductor package including the same, and method for wirelessly testing using the same

by OH SE-JANG, AN YOUNG-SOO, CHO CHANG-HYUN, BYUN EUN-JO, LEE SANG-HOON
Year of Publication 04.02.2010

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APPARATUS FOR TESTING SEMICONDUCTOR DEVICE AND METHOD FOR TESTING

by AN, YOUNG SOO, KIM, JUNG HYEON, JEONG, MAN JIN, BAE, SUNG HOON, CHOI, HO JEONG
Year of Publication 01.08.2008

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Probe card for test of semiconductor chips and method for test of semiconductor chips using the same

by AN YOUNG-SOO, KIM MYOUNG-SUB, CHOI HO-JEONG, BAE SUNG-HOON, KIM JUNG-HYEON
Year of Publication 10.07.2008

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System and method for testing semiconductor integrated circuit in parallel

by AN YOUNG-SOO, KIM MIN-GU, CHOI HO-JEONG, KIM JUNG-HYEON
Year of Publication 10.07.2008

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Multilayer type test board assembly for high-precision inspection

by AN YOUNG-SOO, KIM MIN-GU, CHOI HO-JEONG, KIM JUNG-HYEON
Year of Publication 10.07.2008

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PROBE CARD FOR SEMICONDUCTOR CHIP TEST AND SEMICONDUCTOR CHIP TEST METHOD THEREOF

by AN, YOUNG SOO, KIM, JUNG HYEON, BAE, SUNG HOON, CHOI, HO JEONG, KIM, MYOUNG SUB
Year of Publication 09.07.2008

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TEST BOARD OF MULTILAYER TYPE FOR HIGH-PRECISION INSPECTION

by AN, YOUNG SOO, KIM, JUNG HYEON, KIM, MIN GU, CHOI, HO JEONG
Year of Publication 09.07.2008

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PARALLEL TYPE TEST SYSTEM FOR SEMICONDUCTOR DEVICE AND METHOD OF TESTING SEMICONDUCTOR DEVICE IN PARALLEL

by AN, YOUNG SOO, KIM, JUNG HYEON, KIM, MIN GU, CHOI, HO JEONG
Year of Publication 09.07.2008

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Interposer and a probe card assembly for electrical die sorting and methods of operating and manufacturing the same

by OH SE-JANG, AN YOUNG-SOO, KIM DONG-YEOP, LEE HAL-YOUNG, LEE SANG-HOON, JOO SUNG-HO
Year of Publication 30.07.2009

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MODULE AND METHOD FOR TRANSMITTING ELECTRICAL SIGNALS AND APPARATUS FOR INSPECTING ELECTRIC CONDITION HAVING THE MODULE

by AN, YOUNG SOO, LEE, SANG HOON, KIM, GYU YEOL, CHOI, HO JEONG, OH, SE JANG
Year of Publication 02.02.2009

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ELECTRICAL SIGNAL TRANSMISSION MODULE, METHOD OF TRANSMITTING ELECTRIC SIGNALS AND ELECTRICAL INSPECTION APPARATUS HAVING THE SAME

by OH SE-JANG, AN YOUNG-SOO, KIM GYU-YEOL, CHOI HO-JEONG, LEE SANG-HOON
Year of Publication 29.01.2009

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Connector for testing a semiconductor package

by AN YOUNG-SOO, HWANG SOON-GEOL, BANG JEONG-HO, SHIM HYUN-SEOP, SEO HYUN-KYO, CHUNG YOUNG-BAE, LEE JAE-IL
Year of Publication 21.10.2008

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TONE-ARM BALANCE ADJUSTER OF RECORDER TURN-TABLE

by AN SOO YOUNG
Year of Publication 05.08.1980

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POSITION DETECTION LCD APPARATUS

by AN, YOUNG-SOO, KIM, JOON-HEE
Year of Publication 15.10.1999

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