Search Results - "ALLMAN DERRYL D. J" :: K.UTB vyhledávací portál

NBTI Characterization with in Situ Poly Heater

by Cheng, Yu-Hsing, Cook, Michael, Allman, Derryl D. J.
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)

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Dielectric Relaxation, Aging and Recovery in High-K MIM Capacitors

by Holden, Konner E. K., Hall, Gavin D. R., Cook, Michael, Kendrick, Chris, Pabst, Kaitlyn, Greenwood, Bruce, Daugherty, Robin, Gambino, Jeff P., Allman, Derryl D. J.
Published in 2021 IEEE International Reliability Physics Symposium (IRPS) (01.03.2021)

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On the distribution of stress-induced voiding failures under vias

by Hall, Gavin D. R., Allman, Derryl D. J.
Published in 2014 IEEE International Reliability Physics Symposium (01.06.2014)

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Impact of via interactions and metal slotting on stress induced voiding

by Hall, G.D.R., Allman, D.D.J., Bhatt, H.D.
Published in 2008 IEEE International Reliability Physics Symposium (01.04.2008)

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Interactions and self-healing of Cu vias during stress migration tests and implications for burn-in and design rule formulations

by Hall, Gavin D. R., Allman, Derryl D. J.
Published in 2017 IEEE International Reliability Physics Symposium (IRPS) (01.04.2017)

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An evaluation of accelerated failure time models of stress-migration and stress-induced voiding failures under vias

by Hall, Gavin D. R., Allman, Derryl D. J.
Published in 2015 IEEE International Reliability Physics Symposium (01.04.2015)

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Engineering the failure-free lifetime for Cu vias

by Hall, Gavin D. R., Allman, Derryl D. J., Eda, Masaichi, Long, Thomas F.
Published in 2016 IEEE International Reliability Physics Symposium (IRPS) (01.04.2016)

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