Degradation of individual cells in a module measured with differential IV analysis
Alers, G.B., Zhou, J., Deline, C., Hacke, P., Kurtz, S.R.
Published in Progress in photovoltaics (01.12.2011)
Published in Progress in photovoltaics (01.12.2011)
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Journal Article
Existence of an orientational electric dipolar response in C60 single crystals
ALERS, G. B, GOLDING, B, KORTAN, A. R, HADDON, R. C, THEIL, F. A
Published in Science (American Association for the Advancement of Science) (24.07.1992)
Published in Science (American Association for the Advancement of Science) (24.07.1992)
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Journal Article
Spin-glass fluctuation statistics : mesoscopic experiments in CuMn
WEISSMAN, W. B, ISRAELOFF, N. E, ALERS, G. B
Published in Journal of magnetism and magnetic materials (01.08.1992)
Published in Journal of magnetism and magnetic materials (01.08.1992)
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Journal Article
Thermoreflectance imaging of defects in thin-film solar cells
Kendig, D, Alers, G B, Shakouri, A
Published in 2010 IEEE International Reliability Physics Symposium (01.05.2010)
Published in 2010 IEEE International Reliability Physics Symposium (01.05.2010)
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Conference Proceeding
Universal-conductance-fluctuation 1/f noise in a metal-insulator composite
Garfunkel, GA, Alers, GB, Weissman, MB, Mochel, JM, VanHarlingen, DJ
Published in Physical review letters (27.06.1988)
Published in Physical review letters (27.06.1988)
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Journal Article
Solar cell interface stability probed by charge extraction
Graham, R L, France, C E, Carter, S A, Alers, G B
Published in 2010 IEEE International Reliability Physics Symposium (01.05.2010)
Published in 2010 IEEE International Reliability Physics Symposium (01.05.2010)
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Conference Proceeding
Stress migration and the mechanical properties of copper
Alers, G.B., Sukamto, J., Woytowitz, P., Lu, X., Kailasam, S., Reid, J.
Published in 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual (2005)
Published in 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual (2005)
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Conference Proceeding
Spin-fluctuation statistics in CuMn
Israeloff, NE, Alers, GB, Weissman, MB
Published in Physical review. B, Condensed matter (01.12.1991)
Published in Physical review. B, Condensed matter (01.12.1991)
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Journal Article
Mesoscopic tests for thermally chaotic states in a CuMn spin glass
Alers, GB, Weissman, MB, Israeloff, NE
Published in Physical review. B, Condensed matter (01.07.1992)
Published in Physical review. B, Condensed matter (01.07.1992)
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Journal Article
Influence of copper purity on microstructure and electromigration
Brongersma, S.H., Vanstreels, K., Wu, W., Zhang, W., Ernur, D., D'Haen, J., Terzieva, V., Van Hove, M., Clarysse, T., Carbonell, L., Vandervorst, W., De Ceuninck, W., Maex, K.
Published in Proceedings of the IEEE 2004 International Interconnect Technology Conference (IEEE Cat. No.04TH8729) (2004)
Published in Proceedings of the IEEE 2004 International Interconnect Technology Conference (IEEE Cat. No.04TH8729) (2004)
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Conference Proceeding
Noise simulations of an Ising model of glassy kinetics
Alers, GB, Weissman, MB, Kinzig, A, Israeloff, N
Published in Physical review. B, Condensed matter (01.12.1987)
Published in Physical review. B, Condensed matter (01.12.1987)
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Journal Article
Quantum dot PbS sub(0.9)Se sub(0.1)/TiO sub(2) heterojunction solar cells
Zhai, G, Church, C P, Breeze, A J, Zhang, D, Alers, G B, Carter, SA
Published in Nanotechnology (12.10.2012)
Published in Nanotechnology (12.10.2012)
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Journal Article
Mesoscopic noise studies of atomic motions in cold amorphous conductors
Garfunkel, GA, Alers, GB, Weissman, MB
Published in Physical review. B, Condensed matter (15.03.1990)
Published in Physical review. B, Condensed matter (15.03.1990)
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Journal Article
Resistance noise in amorphous Ni-Zr: Hydrogen diffusion and universal conductance fluctuations
Alers, GB, Weissman, MB, Averback, RS, Shyu, H
Published in Physical review. B, Condensed matter (15.07.1989)
Published in Physical review. B, Condensed matter (15.07.1989)
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Journal Article
TDDB and voltage-ramp reliability of SiC-base dielectric diffusion barriers in Cu/low-k interconnects
Jow, K., Alers, G.B., Sanganeria, M., Harm, G., Fu, H., Tang, X., Kooi, G., Ray, G.W., Danek, M.
Published in 2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual (2003)
Published in 2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual (2003)
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Conference Proceeding
Embedded DRAM: an element and circuit evaluation
Diodato, P.W., O'Neill, J.H., Wong, Y.-H., Alers, G.B., Vaidya, H.M., Chaudhry, S., Lindenberger, W.S., Dumbri, A.C., Liu, C.-T., Lai, W.Y.-C.
Published in Proceedings of the IEEE 2000 Custom Integrated Circuits Conference (Cat. No.00CH37044) (2000)
Published in Proceedings of the IEEE 2000 Custom Integrated Circuits Conference (Cat. No.00CH37044) (2000)
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Conference Proceeding
Characterization of defects in photovoltaics using thermoreflectance and electroluminescence imaging
Kendig, D, Alers, G B, Shakouri, A
Published in 2010 35th IEEE Photovoltaic Specialists Conference (01.06.2010)
Published in 2010 35th IEEE Photovoltaic Specialists Conference (01.06.2010)
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Conference Proceeding
Ultra-thin gate dielectrics: they break down, but do they fail?
Weir, B.E., Silverman, P.J., Monroe, D., Krisch, K.S., Alam, M.A., Alers, G.B., Sorsch, T.W., Timp, G.L., Baumann, F., Liu, C.T., Ma, Y., Hwang, D.
Published in International Electron Devices Meeting. IEDM Technical Digest (1997)
Published in International Electron Devices Meeting. IEDM Technical Digest (1997)
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Conference Proceeding