풍력발전기의 출력 안정화를 위한 에너지 저장장치 용량 산정 사례연구
강민혁(Min Hyeok Kang), 채상헌(Sang Heon Chae), 안진홍(Jin Hong Ahn), 김일환(Eel-Hwan Kim)
Published in 한국태양에너지학회 논문집 (2017)
Published in 한국태양에너지학회 논문집 (2017)
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Journal Article
A low power and highly reliable 400Mbps mobile DDR SDRAM with on-chip distributed ECC
Saeng-Hwan Kim, Won-Oh Lee, Jung-Ho Kim, Seong-Seop Lee, Sun-Young Hwang, Chang-Il Kim, Tae-Woo Kwon, Bong-Seok Han, Sung-Kwon Cho, Dae-Hui Kim, Jae-Keun Hong, Min-Yung Lee, Sung-Wook Yin, Hyeon-Gon Kim, Jin-Hong Ahn, Yong-Tark Kim, Yo-Hwan Koh, Joong-Sik Kih
Published in 2007 IEEE Asian Solid-State Circuits Conference (01.11.2007)
Published in 2007 IEEE Asian Solid-State Circuits Conference (01.11.2007)
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Conference Proceeding
A 0.1-to-1.5GHz 4.2mW All-Digital DLL with Dual Duty-Cycle Correction Circuit and Update Gear Circuit for DRAM in 66nm CMOS Technology
Yun, Won-Joo, Lee, Hyun Woo, Shin, Dongsuk, Kang, Shin Deok, Yang, Ji Yeon, Lee, Hyeng Ouk, Lee, Dong Uk, Sim, Sujeong, Kim, Young Ju, Choi, Won Jun, Song, Keun Soo, Shin, Sang Hoon, Choi, Hyang Hwa, Moon, Hyung Wook, Kwack, Seung Wook, Lee, Jung Woo, Choi, Young Kyoung, Park, Nak Kyu, Kim, Kwan Weon, Choi, Young Jung, Ahn, Jin-Hong, Yang, Ye Seok
Published in 2008 IEEE International Solid-State Circuits Conference - Digest of Technical Papers (01.02.2008)
Published in 2008 IEEE International Solid-State Circuits Conference - Digest of Technical Papers (01.02.2008)
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Conference Proceeding
A single-loop DLL using an OR-AND duty-cycle correction technique
Keun-Soo Song, Cheul-Hee Koo, Nak-Kyu Park, Kwan-Weon Kim, Young-Jung Choi, Jin-Hong Ahn, Byong-Tae Chung
Published in 2008 IEEE Asian Solid-State Circuits Conference (01.11.2008)
Published in 2008 IEEE Asian Solid-State Circuits Conference (01.11.2008)
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Conference Proceeding
Device degradation model for polysilicon-oxide-nitride-oxide-silicon (SONOS) based on anode hole fluence
Yi, Jeong-Hyong, Lee, Sang-Don, Ahn, Jin-Hong, Shin, Hyungcheol, Park, Young-June, Min, Hong Shick
Published in Microelectronic engineering (01.06.2005)
Published in Microelectronic engineering (01.06.2005)
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Journal Article
Conference Proceeding