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전자 현미경, 전자 현미경을 위한 전자 공급원, 및 전자 현미경을 작동시키는 방법들
by
ADAMEC PAVEL
Year of Publication
30.07.2024
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하전 입자 빔 장치, 주사 전자 현미경, 및 하전 입자 빔 장치를 작동시키는 방법
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ADAMEC PAVEL
Year of Publication
05.10.2023
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HIGH PERFORMANCE INSPECTION SCANNING ELECTRON MICROSCOPE DEVICE AND METHOD OF OPERATING THE SAME
by
ADAMEC PAVEL
Year of Publication
22.04.2021
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HIGH PERFORMANCE INSPECTION SCANNING ELECTRON MICROSCOPE DEVICE AND METHOD OF OPERATING THE SAME
by
ADAMEC PAVEL
Year of Publication
23.01.2020
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HIGH PERFORMANCE INSPECTION SCANNING ELECTRON MICROSCOPE DEVICE AND METHOD OF OPERATING THE SAME
by
ADAMEC PAVEL
Year of Publication
22.01.2020
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ELECTRON MICROSCOPE, ELECTRON SOURCE FOR ELECTRON MICROSCOPE, AND METHODS OF OPERATING AN ELECTRON MICROSCOPE
by
ADAMEC
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Pavel
Year of Publication
30.10.2024
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CHARGED PARTICLE BEAM APPARATUS, SCANNING ELECTRON MICROSCOPE, AND METHOD OF OPERATING A CHARGED PARTICLE BEAM APPARATUS
by
ADAMEC
,
Pavel
Year of Publication
27.12.2023
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ELECTRON MICROSCOPE, ELECTRON SOURCE FOR ELECTRON MICROSCOPE, AND METHODS OF OPERATING AN ELECTRON MICROSCOPE
by
ADAMEC
,
Pavel
Year of Publication
29.06.2023
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ELECTRON MICROSCOPE, ELECTRON SOURCE FOR ELECTRON MICROSCOPE, AND METHODS OF OPERATING AN ELECTRON MICROSCOPE
by
Adamec
,
Pavel
Year of Publication
22.06.2023
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Charged particle beam apparatus, scanning electron microscope, and method of operating a charged particle beam apparatus
by
Adamec
,
Pavel
Year of Publication
11.10.2022
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CHARGED PARTICLE BEAM APPARATUS, SCANNING ELECTRON MICROSCOPE, AND METHOD OF OPERATING A CHARGED PARTICLE BEAM APPARATUS
by
ADAMEC
,
Pavel
Year of Publication
25.08.2022
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CHARGED PARTICLE BEAM APPARATUS, SCANNING ELECTRON MICROSCOPE, AND METHOD OF OPERATING A CHARGED PARTICLE BEAM APPARATUS
by
Adamec
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Pavel
Year of Publication
18.08.2022
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HIGH PERFORMANCE INSPECTION SCANNING ELECTRON MICROSCOPE DEVICE AND METHOD OF OPERATING THE SAME
by
Adamec
,
Pavel
Year of Publication
15.01.2020
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High performance inspection scanning electron microscope device and method of operating the same
by
Adamec
,
Pavel
Year of Publication
10.12.2019
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Electron microscope, electron source for electron microscope, and methods of operating an electron microscope
by
ADAMEC
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PAVEL
Year of Publication
16.11.2023
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Charged particle beam apparatus, scanning electron microscope, and method of operating a charged particle beam apparatus
by
ADAMEC
,
PAVEL
Year of Publication
01.07.2023
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Electron beam device, cold field emitter, and method for regeneration of a cold field emitter
by
Adamec Pavel
Year of Publication
19.12.2017
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High throughput scan deflector and method of manufacturing thereof
by
Adamec
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Pavel
Year of Publication
18.10.2017
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Charged particle beam apparatus, scanning electron microscope, and method of operating a charged particle beam apparatus
by
ADAMEC
,
PAVEL
Year of Publication
16.09.2022
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Housing device for magnetic shielding, housing arrangement for magnetic shielding, charged particle beam device, and method of manufacturing a housing device
by
Adamec Pavel
Year of Publication
06.06.2017
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