Method for Managing Electromigration in SOC'S When Designing for Both Reliability and Manufacturing
Chow, K., Abercrombie, D., Basel, M.
Published in 2006 IEEE International SOC Conference (01.09.2006)
Published in 2006 IEEE International SOC Conference (01.09.2006)
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Conference Proceeding
Semiconductor layout context around a point of interest
Selim, Mohamed Alimam Mohamed, Abercrombie, David A, Hamed, Ahmed Hamed Fathi, Hegazy, Hazem, Bahnas, Mohamed
Year of Publication 09.07.2024
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Year of Publication 09.07.2024
Patent
SEMICONDUCTOR LAYOUT CONTEXT AROUND A POINT OF INTEREST
HAMED, Ahmed Hamed Fathi, ABERCROMBIE, David A, SELIM, Mohamed Alimam Mohamed, BAHNAS, Mohamed, HEGAZY, Hazem
Year of Publication 20.03.2024
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Year of Publication 20.03.2024
Patent
Use of lithography simulation for the calibration of equation-based design rule checks
Abercrombie, David, Pikus, Fedor, Cazan, Cosmin
Published in 2009 46th ACM/IEEE Design Automation Conference (26.07.2009)
Published in 2009 46th ACM/IEEE Design Automation Conference (26.07.2009)
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Conference Proceeding
Efficiently Performing Yield Enhancements by Identifying Dominant Physical Root Cause from Test Fail Data
Sharma, M., Benware, B., Lei Ling, Abercrombie, D., Lee, L., Keim, M., Huaxing Tang, Wu-Tung Cheng, Ting-Pu Tai, Yi-Jung Chang, Lin, R., Man, A.
Published in 2008 IEEE International Test Conference (01.10.2008)
Published in 2008 IEEE International Test Conference (01.10.2008)
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Conference Proceeding
SEMICONDUCTOR LAYOUT CONTEXT AROUND A POINT OF INTEREST
Selim, Mohamed Alimam Mohamed, Abercrombie, David A, Hamed, Ahmed Hamed Fathi, Hegazy, Hazem, Bahnas, Mohamed
Year of Publication 29.09.2022
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Year of Publication 29.09.2022
Patent
Locating disturbances in semiconductor manufacturing with stepwise regression
McCray, A.T., McNames, J., Abercrombie, D.
Published in IEEE transactions on semiconductor manufacturing (01.08.2005)
Published in IEEE transactions on semiconductor manufacturing (01.08.2005)
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Journal Article
SEMICONDUCTOR LAYOUT CONTEXT AROUND A POINT OF INTEREST
HAMED, Ahmed Hamed Fathi, ABERCROMBIE, David A, SELIM, Mohamed Alimam Mohamed, BAHNAS, Mohamed, HEGAZY, Hazem
Year of Publication 06.07.2022
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Year of Publication 06.07.2022
Patent
SEMICONDUCTOR LAYOUT CONTEXT AROUND A POINT OF INTEREST
HAMED-FATEHY, Ahmed, ABERCROMBIE, David A, SELIM, Mohamed Alimam Mohamed, BAHNAS, Mohamed, HEGAZY, Hazem
Year of Publication 04.03.2021
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Year of Publication 04.03.2021
Patent
DFM, DFT, silicon debug and diagnosis -the loop to ensure product yield
Abercrombie, D., Koenemann, B., Tamarapalli, N., Venkataraman, S.
Published in 19th International Conference on VLSI Design held jointly with 5th International Conference on Embedded Systems Design (VLSID'06) (2006)
Published in 19th International Conference on VLSI Design held jointly with 5th International Conference on Embedded Systems Design (VLSID'06) (2006)
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Conference Proceeding
Simultaneous multi-layer fill generation
Abercrombie, David A, Anikin, Eugene, Stedman, John W, Pikus, Fedor G, Grodd, Laurence
Year of Publication 04.02.2020
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Year of Publication 04.02.2020
Patent
An innovative method to automate the waiver of IP-level DRC violations
Ferguson, John, Koranne, Sandeep, Abercrombie, David
Published in 2010 11th International Symposium on Quality Electronic Design (ISQED) (01.03.2010)
Published in 2010 11th International Symposium on Quality Electronic Design (ISQED) (01.03.2010)
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Conference Proceeding