Diagnostics of the technological characteristics of high–power transistors using relaxation impedance spectrometry of thermal processes
Vaskou, A. S., Niss, V. S., Kononenko, V. K., Turtsevich, A. S., Rubtsevich, I. I., Solov’ev, Ya. A., Kerentsev, A. F.
Published in Russian microelectronics (01.12.2015)
Published in Russian microelectronics (01.12.2015)
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Journal Article
Comparative analysis of the thermal resistance profiles of power light-emitting diodes cree and rebel types
Zakgeim, A. L., Chernyakov, A. E., Vaskou, A. S., Kononenko, V. K., Niss, V. S.
Published in 2013 14th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) (01.04.2013)
Published in 2013 14th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) (01.04.2013)
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Conference Proceeding
Thermal characterization of light-emitting sources of Cree types
Vaskou, A. S., Kononenko, V. K., Niss, V. S., Zakgeim, A. L., Chernyakov, A. E.
Published in 2013 IEEE 12th International Conference on Laser and Fiber-Optical Networks Modeling (LFNM 2013) (01.09.2013)
Published in 2013 IEEE 12th International Conference on Laser and Fiber-Optical Networks Modeling (LFNM 2013) (01.09.2013)
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Conference Proceeding