Interfaces in ALD very thin Al2O3/HfO2 stacks studied by ellipsometry
Karmakov, Y, Paskaleva, A, Spassov, D
Published in Journal of physics. Conference series (01.01.2023)
Published in Journal of physics. Conference series (01.01.2023)
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Journal Article
Charge trapping effects in nonvolatile memory cells with HfO2/Al2O3 nanolaminated trapping layer
Spassov, D, Paskaleva, A, Guziewicz, E, Stanchev, T, Ivanov, Tz
Published in Journal of physics. Conference series (01.01.2023)
Published in Journal of physics. Conference series (01.01.2023)
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Journal Article
A comparative study of charge trapping in HfO2/Al2O3 and ZrO2/Al2O3 based multilayered metal/high-k/oxide/Si structures
Spassov, D., Skeparovski, A., Paskaleva, A., Novkovski, N.
Published in Thin solid films (01.09.2016)
Published in Thin solid films (01.09.2016)
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Journal Article
Electric, dielectric and optical properties of Ga2O3 grown by metal organic chemical vapour deposition
Paskaleva, A, Spassov, D, Terziyska, P
Published in Journal of physics. Conference series (01.01.2017)
Published in Journal of physics. Conference series (01.01.2017)
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Journal Article
Hole and electron trapping in HfO2/Al2O3 nanolaminated stacks for emerging non-volatile flash memories
Spassov, D, Paskaleva, A, Krajewski, T A, Guziewicz, E, Luka, G
Published in Nanotechnology (14.12.2018)
Published in Nanotechnology (14.12.2018)
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Journal Article
Blast pressures and waveforms of consumer firecrackers
Kirschman, J., Pokutta-Paskaleva, A., Courtney, A., Courtney, M.
Published in Shock waves (01.04.2021)
Published in Shock waves (01.04.2021)
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Journal Article
Magneto-optical characterization of ZnO / Ni nano-laminate obtained via Atomic Layer Deposition
Buchkov, K, Galluzzi, A, Blagoev, B, Paskaleva, A, Terziyska, P, Stanchev, T, Mehandzhiev, V, Tzvetkov, P, Kovacheva, D, Avramova, I, Nazarova, E, Polichetti, M
Published in Journal of physics. Conference series (01.02.2021)
Published in Journal of physics. Conference series (01.02.2021)
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Journal Article
Comparison of ALD-grown thin ZnO films with various thicknesses for NO2 sensing
Boyadjiev, S I, Georgieva, V, Szilágyi, I M, Vergov, L, Georgieva, B, Paskaleva, A
Published in Journal of physics. Conference series (01.04.2020)
Published in Journal of physics. Conference series (01.04.2020)
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Journal Article
Optimization of ALD grown Ni-, Co- and Fe-doped ZnO films
Blagoev, B, Terziyska, P, Mehandzhiev, V, Tzvetkov, P, Kovacheva, D, Avramova, I, Ivanova, T, Gesheva, K, Paskaleva, A
Published in Journal of physics. Conference series (01.04.2020)
Published in Journal of physics. Conference series (01.04.2020)
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Journal Article
Resistive switching in TiO2-based metal–insulator–metal structures with Al2O3 barrier layer at the metal/dielectric interface
Hudec, B., Paskaleva, A., Jančovič, P., Dérer, J., Fedor, J., Rosová, A., Dobročka, E., Fröhlich, K.
Published in Thin solid films (31.07.2014)
Published in Thin solid films (31.07.2014)
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Journal Article
Conference Proceeding
Constant current stress of Ti-doped Ta2O5 on nitrided Si
Paskaleva, A, Atanassova, E, Novkovski, N
Published in Journal of physics. D, Applied physics (21.01.2009)
Published in Journal of physics. D, Applied physics (21.01.2009)
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Journal Article
Electrical characteristics of multilayered HfO2-Al2O3 charge trapping stacks deposited by ALD
Spassov, D, Paskaleva, A, Guziewicz, E, Luka, G, AKrajewski, T, Kopalko, K, Wierzbicka, A, Blagoev, B
Published in Journal of physics. Conference series (01.10.2016)
Published in Journal of physics. Conference series (01.10.2016)
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Journal Article
High-k HfO2-Ta2O5 mixed layers: Electrical characteristics and mechanisms of conductivity
ATANASSOVA, E, GEORGIEVA, M, SPASSOV, D, PASKALEVA, A
Published in Microelectronic engineering (01.04.2010)
Published in Microelectronic engineering (01.04.2010)
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Journal Article