Novel read disturb failure mechanism induced by FLASH cycling
Brand, A., Wu, K., Pan, S., Chin, D.
Published in 31st Annual Proceedings Reliability Physics 1993 (1993)
Published in 31st Annual Proceedings Reliability Physics 1993 (1993)
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Conference Proceeding
AC electromigration characterization and modeling of multilayered interconnects
Ting, L.M., May, J.S., Hunter, W.R., McPherson, J.W.
Published in 31st Annual Proceedings Reliability Physics 1993 (1993)
Published in 31st Annual Proceedings Reliability Physics 1993 (1993)
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Conference Proceeding
Soft-error-rate improvement in advanced BiCMOS SRAMs
Burnett, D., Lage, C., Bormann, A.
Published in 31st Annual Proceedings Reliability Physics 1993 (1993)
Published in 31st Annual Proceedings Reliability Physics 1993 (1993)
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Conference Proceeding
Process induced oxide damage and its implications to device reliability of submicron transistors
Rakkhit, R., Heiler, F.P., Fang, P., Sander, C.
Published in 31st Annual Proceedings Reliability Physics 1993 (1993)
Published in 31st Annual Proceedings Reliability Physics 1993 (1993)
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Conference Proceeding
Reliability of 0.1 mu m InP HEMTs
LaCombe, D.J., Hu, W.W., Bardsley, F.R.
Published in 31st Annual Proceedings Reliability Physics 1993 (1993)
Published in 31st Annual Proceedings Reliability Physics 1993 (1993)
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Conference Proceeding
Reliability, yield and quality correlation for a particular failure mechanism
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Conference Proceeding
The dependence of the activation energies of intermetallic formation on the composition of composite Sn/Pb solders
Pinizzotto, R.F., Jacobs, E.G., Wu, Y., Sees, J.A., Foster, L.A., Pouraghabagher, C.
Published in 31st Annual Proceedings Reliability Physics 1993 (1993)
Published in 31st Annual Proceedings Reliability Physics 1993 (1993)
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Conference Proceeding
Gate dielectric integrity and reliability in 0.5- mu m CMOS technology
Strong, A.W., Stamper, A.K., Bolam, R.J., Furukawa, T., Gow, C.J., Gow, T.R., Martin, D.W., Mittl, S.W., Nakos, J.S., Pennington, S.L.
Published in 31st Annual Proceedings Reliability Physics 1993 (1993)
Published in 31st Annual Proceedings Reliability Physics 1993 (1993)
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Conference Proceeding
Analysis of parametric drift of a MESFET-based GaAs MMIC due to 125 degrees C storage
Dreike, P.L., Barton, D.L., Sandoval, C.E.
Published in 31st Annual Proceedings Reliability Physics 1993 (1993)
Published in 31st Annual Proceedings Reliability Physics 1993 (1993)
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Conference Proceeding
Internal current probing of integrated circuits using magnetic force microscopy
Campbell, A.N., Cole, E.I., Dodd, B.A., Anderson, R.E.
Published in 31st Annual Proceedings Reliability Physics 1993 (1993)
Published in 31st Annual Proceedings Reliability Physics 1993 (1993)
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Conference Proceeding
Thickness and other effects on oxide and interface damage by plasma processing
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Conference Proceeding
A criterion for predicting delamination in plastic IC packages
Tay, A.A.O., Tan, G.L., Lim, T.B.
Published in 31st Annual Proceedings Reliability Physics 1993 (1993)
Published in 31st Annual Proceedings Reliability Physics 1993 (1993)
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Conference Proceeding
Evaluation of modern gate oxide technologies to process charging
Crook, D., Domnitei, M., Webb, M., Bonini, J.
Published in 31st Annual Proceedings Reliability Physics 1993 (1993)
Published in 31st Annual Proceedings Reliability Physics 1993 (1993)
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Conference Proceeding