A Novel Design of FPGA-TDC Based on SerDes
Kong, Dexuan, Fu, Zaiming, Dang, Haoyang, Liu, Hanglin, Tang, Xiaoting, Wu, Kunping
Published in 2023 IEEE AUTOTESTCON (28.08.2023)
Published in 2023 IEEE AUTOTESTCON (28.08.2023)
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Conference Proceeding
A Fast Fault Diagnosis Method for RF Front-End Modules Based on Adaptive Signal Decomposition and Deep Neural Network
Tang, Xiaoting, Liu, Zhen, Liang, Jingqun, Wu, Kunping, Bu, Zhiyuan, Chen, Li
Published in 2023 IEEE AUTOTESTCON (28.08.2023)
Published in 2023 IEEE AUTOTESTCON (28.08.2023)
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Conference Proceeding
Design of 16-Channel High-Speed Synchronous Data Acquisition System
Huang, Wuhuang, Fang, Fang, Chen, Aijun, Gan, Yunyu, Pan, Zhixiang, Zhu, Guibing, Pan, Huiqing, Li, Chengyang, Ye, Peng
Published in 2023 IEEE AUTOTESTCON (28.08.2023)
Published in 2023 IEEE AUTOTESTCON (28.08.2023)
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Conference Proceeding
Testing and Diagnosing High-Speed Circuits for Military Applications Through Standard Input/Output Ports
Ungar, Louis Y., Jacobson, Neil G., Mak, T. M., Stoldt, Craig D.
Published in 2023 IEEE AUTOTESTCON (28.08.2023)
Published in 2023 IEEE AUTOTESTCON (28.08.2023)
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Conference Proceeding
An Ultra-High Timing Resolution Waveform Generator Based on Real-Time Computation and DDS
Liu, Hanglin, Fu, Zaiming, Qi, Shirui, Kong, Dexuan, Wang, Houjun
Published in 2023 IEEE AUTOTESTCON (28.08.2023)
Published in 2023 IEEE AUTOTESTCON (28.08.2023)
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Conference Proceeding
A Standard for Prognostics and Health Management in the Context of Automatic Test Systems
Sheppard, John, Carey, David, Neag, Ion, Gould, Eric
Published in 2023 IEEE AUTOTESTCON (28.08.2023)
Published in 2023 IEEE AUTOTESTCON (28.08.2023)
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Conference Proceeding
Testing for Coexistence in Crowded and Contested RF Environments
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Conference Proceeding
Life Prediction of Electronic Equipment Based on the Fusion of Simulation Data and Measurement Data
Bu, Zhiyuan, Long, Bing, Wu, Kunping, Tang, Xiaoting, Liu, Zhen
Published in 2023 IEEE AUTOTESTCON (28.08.2023)
Published in 2023 IEEE AUTOTESTCON (28.08.2023)
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Conference Proceeding
Practical Application of Model-Based Testing in Aerospace Manufacturing
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Conference Proceeding
Software Defined Instrument Based Electromagnetic Warfare Test System
Stewart, James L., Lowdermilk, Robert Wade, Carey, David R.
Published in 2023 IEEE AUTOTESTCON (28.08.2023)
Published in 2023 IEEE AUTOTESTCON (28.08.2023)
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Conference Proceeding
A Fast Temperature Compensation Method for Digital Oscilloscope Amplitude Calibration
Huang, Wuhuang, Zuo, Zhipeng, Zhu, Guibing, Chen, Aijun, Meng, Jie, Qiu, Duyu, Pan, Huiqing, Li, Chengyang, Wang, Houjun
Published in 2023 IEEE AUTOTESTCON (28.08.2023)
Published in 2023 IEEE AUTOTESTCON (28.08.2023)
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Conference Proceeding
The Segmented Storage System in Digital Oscilloscope
Huang, Chuan, Tian, Shulin, Ye, Peng, Zhang, Qinchuan, Li, Chengyang
Published in 2023 IEEE AUTOTESTCON (28.08.2023)
Published in 2023 IEEE AUTOTESTCON (28.08.2023)
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Conference Proceeding