Investigation of First Fire Effect on VTH Stability and Endurance in GeCTe Selector
Chang, P. C., Liao, P. J., Heh, D. W., Lee, C., Hou, D. H., Ambrosi, E., Wu, C. H., Lee, H. Y., Lee, J. H., Bao, X. Y.
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
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Conference Proceeding
An Abnormal Negative Temperature Dependence of Erasestate Vt Retention Shift in 3-D NAND Flash Memories
Liu, Y. H., Yang, Y. S., Zhan, T. C., Hu, M., Liu, Z. J., Lin, W., Liu, A. C., Hsu, Y. C.
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
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Conference Proceeding
Analysis and Modeling of Vth Shift in 4H-SiC MOSFETs at Room and Cryogenic-Temperature
Masin, F., De Santi, C., Stockman, A., Lettens, J., Geenen, F., Meneghesso, G., Zanoni, E., Moens, P., Meneghini, M.
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
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Conference Proceeding
Identification of Interface States responsible for VTH Hysteresis in packaged SiC MOSFETs
Cioni, M., Fiorenza, P., Roccaforte, F., Saggio, M., Cascino, S., Messina, A., Vinciguerra, V., Calabretta, M., Chini, A.
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
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Conference Proceeding
Pre-O2 treatment for LNA gate oxide leakage improvement
Ke, Zheng, Goyal, Sachin, Arputharaj, Solomon, Wendy Lau, Wee Yee, Tam Lyn, Tan, Fatt, Lim Dau, Madhavan, Pandurangan, Venkataramani, Chandrasekar
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
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Conference Proceeding
Novel High Voltage Bias Temperature Instabilities (HV-BTI) setup to monitor RON/VTH drift on GaN-on-Si E-mode MOSc-HEMTs under drain voltage
Leurquin, C., Vandendaele, W., Viey, A.G, Gwoziecki, R., Escoffier, R., Salot, R., Despesse, G., Iucolano, F., Modica, R., Constant, A.
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
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Conference Proceeding
Interpretation and modelling of dynamic-RON kinetics in GaN-on-Si HEMTs for mm-wave applications
Putcha, V., Yu, H., Franco, J., Yadav, S., Alian, A., Peralagu, U., Parvais, B., Collaert, N.
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
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Conference Proceeding
Correlation between Access Polarization and High Endurance (˜ 1012 cycling) of Ferroelectric and Anti-Ferroelectric HfZrO2
Hsiang, K.-Y., Liao, C.-Y., Lin, Y.-Y., Lou, Z.-F., Lin, C.-Y., Lee, J.-Y., Chang, F.-S., Li, Z.-X., Tseng, H.-C., Wang, C.-C., Ray, W.-C., Hou, T.-H., Chen, T.-C., Chang, C.-S., Lee, M. H.
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
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Conference Proceeding
Characterization and Modelling of Hot Carrier Degradation in pFETs under Vd>Vg Condition for sub-20nm DRAM Technologies
Wang, Da, Liu, Yong, Ren, Pengpeng, Zhou, Longda, Ji, Zhigang, Liu, Junhua, Wang, Runsheng, Huang, Ru
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
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Conference Proceeding
SiO2/4H-SiC interfacial chemistry as origin of the threshold voltage instability in power MOSFETs
Fiorenza, P., Bongiorno, C., Messina, A., Saggio, M., Giannazzo, F., Roccaforte, F.
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
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Conference Proceeding
Decoupling of NBTI and Pure HCD Contributions in p-GAA SNS FETs Under Mixed VG/VD Stress
Choudhury, Nilotpal, Ranjan, Ayush, Mahapatra, Souvik
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
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Conference Proceeding
Reliability of Ferroelectric and Antiferroelectric Si:HfO2 materials in 3D capacitors by TDDB studies
Viegas, A., Falidas, K., Ali, T., Kuhnel, K., Hoffmann, R., Mart, C., Czernohorsky, M., Heitmann, J.
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
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Conference Proceeding
Ultra-fast CV methods (< 10µs) for interface trap spectroscopy and BTI reliability characterization using MOS capacitors
Frutuoso, T. Mota, Garros, X., Lugo-Alvarez, J., Kammeugne, R. K., Zouknak, L. D. M., Viey, A., Vandendeale, W., Ferrari, P., Gaillard, F.
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
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Conference Proceeding
Towards the Characterization of Full ID-VG Degradation in Transistors for Future Analog Applications
Ren, Pengpeng, Zhang, Xinfa, Liu, Junhua, Wang, Runsheng, Ji, Zhigang, Huang, Ru
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
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Conference Proceeding
The Price of Secrecy: How Hiding Internal DRAM Topologies Hurts Rowhammer Defenses
Saroiu, Stefan, Wolman, Alec, Cojocar, Lucian
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
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Conference Proceeding
Simulation Comparison of Hot-Carrier Degradation in Nanowire, Nanosheet and Forksheet FETs
Vandemaele, Michiel, Kaczer, Ben, Tyaginov, Stanislav, Bury, Erik, Chasin, Adrian, Franco, Jacopo, Makarov, Alexander, Mertens, Hans, Hellings, Geert, Groeseneken, Guido
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
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Conference Proceeding
A Ring-Oscillator-Based Degradation Monitor Concept with Tamper Detection Capability
Diaz-Fortuny, Javier, Saraza-Canflanca, Pablo, Bury, Erik, Vandemaele, Michiel, Kaczer, Ben, Degraeve, Robin
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
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Conference Proceeding
Evaluating Forksheet FET Reliability Concerns by Experimental Comparison with Co-integrated Nanosheets
Bury, E., Chasin, A., Kaczer, B., Vandemaele, M., Tyaginov, S., Franco, J., Ritzenthaler, R., Mertens, H., Weckx, P., Horiguchi, N., Linten, D.
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
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Conference Proceeding
Cleaved-Gate Ferroelectric FET for Reliable Multi-Level Cell Storage
Bagga, Navjeet, Ni, Kai, Chauhan, Nitanshu, Prakash, Om, Hu, X. Sharon, Amrouch, Hussam
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
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Conference Proceeding
The Field-dependence Endurance Model and Its Mutual Effect in Hf-based Ferroelectrics
Chang, Y. K., Liao, P. J., Yeong, S. H., Lin, Y.-M., Lee, J. H., Lin, C. T., Yu, Z., Tsai, W., McIntyre, P. C.
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
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Conference Proceeding