Performance Improvement and Reliability Physics in SiC MOSFETs
Kimoto, T., Tachiki, K., Iijima, A., Kaneko, M.
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
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Conference Proceeding
Insights on Inter-metal Reliability Assessment of High Voltage Interconnects
Yew, Kwang Sing, Ong, Ran Xing, Yap, Hin Kiong, Yi, Wanbing, Phang, Jacquelyn, Chockalingam, R., Tan, Juan Boon
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
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Conference Proceeding
Thermal-Neutron SER Mitigation by Cobalt-Contact in 7 nm Bulk-FinFET Technology
Uemura, Taiki, Chung, Byungjin, Kim, Jegon, Shim, Hyewon, Chung, Shinyoung, Lee, Brandon, Choi, Jaehee, Ohnishi, Shota, Machida, Ken
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
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Conference Proceeding
6G Roadmap for Semiconductor Technologies: Challenges and Advances
Cahoon, N., Srinivasan, P., Guarin, F.
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
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Conference Proceeding
Reliability Analysis of Physically Unclonable Function by Using Aging Variability Simulation
Ahn, Jae-Gyung, Wesselkamper, Jim, Baek, Ryan SW, Yeh, Ping-Chin, Chang, Jonathan, Wong, Jennifer, Wu, Xin
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
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Conference Proceeding
Modeling Hot-Electron Trapping in GaN-based HEMTs
Modolo, Nicola, De Santi, Carlo, Minetto, Andrea, Sayadi, Luca, Sicre, Sebastien, Prechtl, Gerhard, Meneghesso, Gaudenzio, Zanoni, Enrico, Meneghini, Matteo
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
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Conference Proceeding
NBTI Characterization with in Situ Poly Heater
Cheng, Yu-Hsing, Cook, Michael, Allman, Derryl D. J.
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
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Conference Proceeding
22FDX™ 5G 28GHz 20dBm Power Amplifier Constant Load and VSWR accelerated aging reliability
Bossu, G., Syed, S., Evseev, S., Jerome, J.A.S., Arfaoui, W., Lipp, D., Siddabathula, M.
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
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Conference Proceeding
Optical Emission Correlated to Bias Temperature Instability in SiC MOSFETs
Feil, Maximilian W., Reisinger, Hans, Kabakow, Andre, Aichinger, Thomas, Gustin, Wolfgang, Grasser, Tibor
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
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Conference Proceeding
Ferroelectric FET Threshold Voltage Optimization for Reliable In-Memory Computing
Prakash, Om, Ni, Kai, Amrouch, Hussam
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
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Conference Proceeding
A High Voltage Tolerant Supply Clamp for ESD Protection in a 45-nm SOI Technology
Huang, Shudong, Parthasarathy, Srivatsan, Zhou, Yuanzhong Paul, Hajjar, Jean-Jacques, Rosenbaum, Elyse
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
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Conference Proceeding
A Novel Latch-Up-Immune DDSCR Used for 12 V Applications
Zhu, Zhihua, Wang, Songyan, Fan, Xiaomei
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
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Conference Proceeding
High-k MIM dielectric reliability study in 65nm node
Achanta, Ravi, McGahay, V., Boffoli, S., Kothandaraman, C., Gambino, J.
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
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Conference Proceeding